<div class="csl-bib-body">
<div class="csl-entry">Bhosale, P., Kastner, W., & Sauter, T. (2023). Integrated Safety-Security Risk Assessment for Industrial Control System: An Ontology-based Approach. In <i>2023 IEEE 28th International Conference on Emerging Technologies and Factory Automation (ETFA)</i> (pp. 1–8). IEEE. https://doi.org/10.1109/ETFA54631.2023.10275530</div>
</div>
-
dc.identifier.uri
http://hdl.handle.net/20.500.12708/189825
-
dc.description.abstract
Industrial control systems (ICSs) are critical to the operation of industrial processes and critical infrastructure. Safety and security are crucial in any system or process, particularly in ICSs where failures can lead to severe consequences such as injury, loss of life, and damage to equipment and infrastructure. However, safety and security are often considered separately during the concept and design stages. An integrated risk assessment approach can combine safety and security considerations and provide a holistic evaluation of the overall risk to ICSs. Ontology-based approaches provide a systematic and structured method for representing knowledge and concepts related to risk assessment in industry. The aim of this paper is to develop an ontology based approach and generate a concept for integrating safety and security risk assessment. A case study is analysed using the ontology with a SPARQL query example.
en
dc.description.sponsorship
TÜV Austria Holding AG
-
dc.language.iso
en
-
dc.subject
industrial control system
en
dc.subject
ontology
en
dc.subject
risk assessment
en
dc.subject
safety
en
dc.subject
security
en
dc.title
Integrated Safety-Security Risk Assessment for Industrial Control System: An Ontology-based Approach
en
dc.type
Inproceedings
en
dc.type
Konferenzbeitrag
de
dc.relation.isbn
9798350339918
-
dc.relation.issn
1946-0740
-
dc.description.startpage
1
-
dc.description.endpage
8
-
dc.type.category
Full-Paper Contribution
-
dc.relation.eissn
1946-0759
-
tuw.booktitle
2023 IEEE 28th International Conference on Emerging Technologies and Factory Automation (ETFA)
-
tuw.peerreviewed
true
-
tuw.relation.publisher
IEEE
-
tuw.relation.publisherplace
Piscataway
-
tuw.project.title
Automated Risk Management for Industrial Control Systems
-
tuw.researchTopic.id
I6
-
tuw.researchTopic.id
I2
-
tuw.researchTopic.id
I3
-
tuw.researchTopic.name
Digital Transformation in Manufacturing
-
tuw.researchTopic.name
Computer Engineering and Software-Intensive Systems
-
tuw.researchTopic.name
Automation and Robotics
-
tuw.researchTopic.value
20
-
tuw.researchTopic.value
60
-
tuw.researchTopic.value
20
-
tuw.publication.orgunit
E191-03 - Forschungsbereich Automation Systems
-
tuw.publication.orgunit
E384-01 - Forschungsbereich Software-intensive Systems
-
tuw.publisher.doi
10.1109/ETFA54631.2023.10275530
-
dc.description.numberOfPages
8
-
tuw.author.orcid
0000-0001-5420-404X
-
tuw.event.name
2023 IEEE 28th International Conference on Emerging Technologies and Factory Automation (ETFA)
en
tuw.event.startdate
12-09-2023
-
tuw.event.enddate
15-09-2023
-
tuw.event.online
On Site
-
tuw.event.type
Event for scientific audience
-
tuw.event.place
Sinaia
-
tuw.event.country
RO
-
tuw.event.presenter
Bhosale, Pushparaj
-
wb.sciencebranch
Informatik
-
wb.sciencebranch
Elektrotechnik, Elektronik, Informationstechnik
-
wb.sciencebranch.oefos
1020
-
wb.sciencebranch.oefos
2020
-
wb.sciencebranch.value
70
-
wb.sciencebranch.value
30
-
item.languageiso639-1
en
-
item.fulltext
no Fulltext
-
item.openairetype
conference paper
-
item.cerifentitytype
Publications
-
item.openairecristype
http://purl.org/coar/resource_type/c_5794
-
item.grantfulltext
none
-
crisitem.author.dept
E191-03 - Forschungsbereich Automation Systems
-
crisitem.author.dept
E640 - Vizerektorat Digitalisierung und Infrastruktur
-
crisitem.author.dept
E384 - Institut für Computertechnik
-
crisitem.author.orcid
0000-0001-5420-404X
-
crisitem.author.parentorg
E191 - Institut für Computer Engineering
-
crisitem.author.parentorg
E000 - Technische Universität Wien
-
crisitem.author.parentorg
E350 - Fakultät für Elektrotechnik und Informationstechnik