<div class="csl-bib-body">
<div class="csl-entry">Hradil, K. (2023, August 8). <i>Grazing incidence X-ray diffraction (GIXD)</i> [Presentation]. Denver X-ray Conference 2023, Lombard, United States of America (the).</div>
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/190390
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dc.description.abstract
The characterization of layered structures from the nanometer range to the 10 µm range is of increasing importance, especially if the analytical methods are non-destructive.
The third part of the workshop, presented by Klaudia Hradil, will include the theoretical background and experimental techniques of thin film analysis by X-ray diffraction methods. This will include the experimental techniques and the analysis of data for grazing incidence diffraction. The possibilities for the microstructure properties analysis of thin films like stress/strain and texture analysis, classical phase analysis and thin film crystallinity properties with lab methods will be introduced for selected examples.
