DC Field
Value
Language
dc.contributor.author
Stöger-Pollach, Michael
-
dc.contributor.author
Bukvisová, Kristýna
-
dc.contributor.author
Zenz, Keanu
-
dc.contributor.author
Stöger, Leo
-
dc.contributor.author
Scales, Ze
-
dc.date.accessioned
2024-01-10T09:34:49Z
-
dc.date.available
2024-01-10T09:34:49Z
-
dc.date.issued
2023-04-03
-
dc.identifier.citation
<div class="csl-bib-body"> <div class="csl-entry">Stöger-Pollach, M., Bukvisová, K., Zenz, K., Stöger, L., &#38; Scales, Z. (2023, April 3). <i>Investigations of Optical Excitations in Semiconductors using Scanning Transmission Electron Microscopy</i> [Conference Presentation]. Microscopy of Semiconducting Materials 2023, Cambridge, United Kingdom of Great Britain and Northern Ireland (the). http://hdl.handle.net/20.500.12708/191457</div> </div>
-
dc.identifier.uri
http://hdl.handle.net/20.500.12708/191457
-
dc.language.iso
en
-
dc.subject
Semiconductors
en
dc.title
Investigations of Optical Excitations in Semiconductors using Scanning Transmission Electron Microscopy
en
dc.type
Presentation
en
dc.type
Vortrag
de
dc.contributor.affiliation
Infineon Technologies (Austria), Austria
-
dc.type.category
Conference Presentation
-
tuw.publication.invited
invited
-
tuw.researchinfrastructure
Universitäre Service-Einrichtung für Transmissionselektronenmikroskopie
-
tuw.researchTopic.id
M2
-
tuw.researchTopic.id
M5
-
tuw.researchTopic.name
Materials Characterization
-
tuw.researchTopic.name
Composite Materials
-
tuw.researchTopic.value
50
-
tuw.researchTopic.value
50
-
tuw.publication.orgunit
E057-02 - Fachbereich Universitäre Serviceeinrichtung für Transmissions- Elektronenmikroskopie
-
tuw.author.orcid
0000-0002-5450-4621
-
tuw.author.orcid
0009-0002-1864-0316
-
tuw.event.name
Microscopy of Semiconducting Materials 2023
en
tuw.event.startdate
03-04-2023
-
tuw.event.enddate
06-04-2023
-
tuw.event.online
On Site
-
tuw.event.type
Event for scientific audience
-
tuw.event.place
Cambridge
-
tuw.event.country
GB
-
tuw.event.presenter
Stöger-Pollach, Michael
-
tuw.event.track
Single Track
-
wb.sciencebranch
Chemie
-
wb.sciencebranch
Nanotechnologie
-
wb.sciencebranch
Physik, Astronomie
-
wb.sciencebranch.oefos
1040
-
wb.sciencebranch.oefos
2100
-
wb.sciencebranch.oefos
1030
-
wb.sciencebranch.value
30
-
wb.sciencebranch.value
40
-
wb.sciencebranch.value
30
-
item.grantfulltext
none
-
item.openairecristype
http://purl.org/coar/resource_type/c_18cp
-
item.openairetype
conference paper not in proceedings
-
item.cerifentitytype
Publications
-
item.fulltext
no Fulltext
-
item.languageiso639-1
en
-
crisitem.author.dept
E057-02 - Fachbereich Universitäre Serviceeinrichtung für Transmissions- Elektronenmikroskopie
-
crisitem.author.dept
Infineon Technologies (Austria), Austria
-
crisitem.author.orcid
0000-0002-5450-4621
-
crisitem.author.orcid
0009-0002-1864-0316
-
crisitem.author.parentorg
E057 - Facilities und Zentren
-
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