<div class="csl-bib-body">
<div class="csl-entry">Scales, Z., Koller, C. M., Schoemann, S., Nelhiebel, M., Reisinger, M., Jatzkowski, J., Diehle, P., & Stöger-Pollach, M. (2023, November 13). <i>Identifying Electrically Active Dislocations in GaN and the Challenge of Cross-Correlative Physical Characterization</i> [Conference Presentation]. ISTFA 2023, Phoenix, United States of America (the). http://hdl.handle.net/20.500.12708/191472</div>
</div>
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/191472
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dc.language.iso
en
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dc.subject
Electrically Active Dislocations
en
dc.title
Identifying Electrically Active Dislocations in GaN and the Challenge of Cross-Correlative Physical Characterization
en
dc.type
Presentation
en
dc.type
Vortrag
de
dc.contributor.affiliation
TU Wien, Austria
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dc.contributor.affiliation
KAl Kompetenzzentrum Automobil- und lndustrieelektronik GmbH, Österreich
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dc.contributor.affiliation
Kompetenzzentrum Automobil- und Industrieelektronik GmbH
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dc.contributor.affiliation
Fraunhofer Institute for Microstructure of Materials and Systems, Germany
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dc.type.category
Conference Presentation
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tuw.researchinfrastructure
Universitäre Service-Einrichtung für Transmissionselektronenmikroskopie
