DC Field
Value
Language
dc.contributor.author
Yilmaz, Ufuk
-
dc.contributor.author
Ramer, Georg
-
dc.contributor.author
Lendl, Bernhard
-
dc.date.accessioned
2024-01-24T09:37:29Z
-
dc.date.available
2024-01-24T09:37:29Z
-
dc.date.issued
2023-04-14
-
dc.identifier.citation
<div class="csl-bib-body"> <div class="csl-entry">Yilmaz, U., Ramer, G., &#38; Lendl, B. (2023, April 14). <i>Introducing flat, silicon ATR for bottom illuminated AFM-IR measurements</i> [Conference Presentation]. ANAKON 2023, Wien, Austria.</div> </div>
-
dc.identifier.uri
http://hdl.handle.net/20.500.12708/192649
-
dc.language.iso
en
-
dc.subject
infrared spectroscopy
en
dc.title
Introducing flat, silicon ATR for bottom illuminated AFM-IR measurements
en
dc.type
Presentation
en
dc.type
Vortrag
de
dc.type.category
Conference Presentation
-
tuw.researchTopic.id
M1
-
tuw.researchTopic.id
C6
-
tuw.researchTopic.id
M4
-
tuw.researchTopic.name
Surfaces and Interfaces
-
tuw.researchTopic.name
Modeling and Simulation
-
tuw.researchTopic.name
Non-metallic Materials
-
tuw.researchTopic.value
40
-
tuw.researchTopic.value
30
-
tuw.researchTopic.value
30
-
tuw.publication.orgunit
E164-02-1 - Forschungsgruppe Prozessanalytik
-
tuw.author.orcid
0000-0001-8307-5435
-
tuw.author.orcid
0000-0003-3838-5842
-
tuw.event.name
ANAKON 2023
en
tuw.event.startdate
11-04-2023
-
tuw.event.enddate
14-04-2023
-
tuw.event.online
On Site
-
tuw.event.type
Event for scientific audience
-
tuw.event.place
Wien
-
tuw.event.country
AT
-
tuw.event.institution
TU Wien
-
tuw.event.presenter
Yilmaz, Ufuk
-
tuw.event.track
Multi Track
-
wb.sciencebranch
Chemie
-
wb.sciencebranch.oefos
1040
-
wb.sciencebranch.value
100
-
item.languageiso639-1
en
-
item.openairecristype
http://purl.org/coar/resource_type/c_18cp
-
item.openairetype
conference paper not in proceedings
-
item.cerifentitytype
Publications
-
item.fulltext
no Fulltext
-
item.grantfulltext
none
-
crisitem.author.dept
E164-02-1 - Forschungsgruppe Prozessanalytik
-
crisitem.author.dept
E164-02-1 - Forschungsgruppe Prozessanalytik
-
crisitem.author.dept
E164-02 - Forschungsbereich Umwelt-, Prozessanalytik und Sensoren
-
crisitem.author.orcid
0000-0001-8307-5435
-
crisitem.author.orcid
0000-0003-3838-5842
-
crisitem.author.parentorg
E164-02 - Forschungsbereich Umwelt-, Prozessanalytik und Sensoren
-
crisitem.author.parentorg
E164-02 - Forschungsbereich Umwelt-, Prozessanalytik und Sensoren
-
crisitem.author.parentorg
E164 - Institut für Chemische Technologien und Analytik
-
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