<div class="csl-bib-body">
<div class="csl-entry">Wilhelmer, C., Waldhör, D., Cvitkovich, L., Waltl, M., & Grasser, T. (2023). Ab initio investigations of electron and hole trapping processes of H induced defects in amorphous SiO₂. In <i>The 14th International Conference on SiO₂, Dielectrics and Related Devices : Book of Abstracts</i> (pp. 18–19).</div>
</div>
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/192886
-
dc.description.sponsorship
Christian Doppler Forschungsgesells
-
dc.language.iso
en
-
dc.subject
Ab initio studies in amorphous SiO2
en
dc.subject
Nonradiative multi-phonon defect model
en
dc.subject
Hydroxyl-E′ center
en
dc.subject
Electron/hole traps
en
dc.subject
Metastability of defects
en
dc.subject
MOSFET
en
dc.subject
Bias temperature instability
en
dc.subject
Random telegraph noise
en
dc.title
Ab initio investigations of electron and hole trapping processes of H induced defects in amorphous SiO₂
en
dc.type
Inproceedings
en
dc.type
Konferenzbeitrag
de
dc.description.startpage
18
-
dc.description.endpage
19
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dc.relation.grantno
00000000
-
dc.type.category
Abstract Book Contribution
-
tuw.booktitle
The 14th International Conference on SiO₂, Dielectrics and Related Devices : Book of Abstracts
-
tuw.project.title
CD-Labor für Einzeldefektspektroskopie in Halbleiterbauelementen
-
tuw.researchinfrastructure
Vienna Scientific Cluster
-
tuw.researchTopic.id
Q3
-
tuw.researchTopic.id
C1
-
tuw.researchTopic.name
Quantum Modeling and Simulation
-
tuw.researchTopic.name
Computational Materials Science
-
tuw.researchTopic.value
50
-
tuw.researchTopic.value
50
-
tuw.publication.orgunit
E360-01 - Forschungsbereich Mikroelektronik
-
dc.description.numberOfPages
2
-
tuw.event.name
The 14th International conference on SiO2, advanced dielectrics and related devices
en
tuw.event.startdate
12-06-2023
-
tuw.event.enddate
14-06-2023
-
tuw.event.online
On Site
-
tuw.event.type
Event for scientific audience
-
tuw.event.place
Palermo
-
tuw.event.country
IT
-
tuw.event.presenter
Wilhelmer, Christoph
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wb.sciencebranch
Elektrotechnik, Elektronik, Informationstechnik
-
wb.sciencebranch.oefos
2020
-
wb.sciencebranch.value
100
-
item.languageiso639-1
en
-
item.grantfulltext
restricted
-
item.cerifentitytype
Publications
-
item.openairetype
conference paper
-
item.openairecristype
http://purl.org/coar/resource_type/c_5794
-
item.fulltext
no Fulltext
-
crisitem.author.dept
E360-01 - Forschungsbereich Mikroelektronik
-
crisitem.author.dept
E360-01 - Forschungsbereich Mikroelektronik
-
crisitem.author.dept
E360-01 - Forschungsbereich Mikroelektronik
-
crisitem.author.dept
E360-01 - Forschungsbereich Mikroelektronik
-
crisitem.author.dept
E360 - Institut für Mikroelektronik
-
crisitem.author.orcid
0000-0002-8631-5681
-
crisitem.author.orcid
0000-0001-6042-759X
-
crisitem.author.parentorg
E360 - Institut für Mikroelektronik
-
crisitem.author.parentorg
E360 - Institut für Mikroelektronik
-
crisitem.author.parentorg
E360 - Institut für Mikroelektronik
-
crisitem.author.parentorg
E360 - Institut für Mikroelektronik
-
crisitem.author.parentorg
E350 - Fakultät für Elektrotechnik und Informationstechnik
