<div class="csl-bib-body">
<div class="csl-entry">Bhosale, P., Kastner, W., & Sauter, T. (2023). Integrated Safety-Security Risk Assessment for Production Systems: A Use Case Using Bayesian Belief Networks. In <i>2023 IEEE 21st International Conference on Industrial Informatics (INDIN)</i>. 21st International Conference on Industrial Informatics (INDIN), Lemgo, Germany. IEEE. https://doi.org/10.1109/INDIN51400.2023.10217926</div>
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/193243
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dc.description.abstract
Industrial control systems (ICSs) are complex networked systems that enable automation of large-scale processes. Depending on the application domain, the risk of the failure of components can have catastrophic repercussions. Up to now, a safety risk assessment is carried out to identify and narrow down possible failures. However, with the recent increase of cybersecurity attacks, a need of an integrated safety and security risk assessment is rising. This encompasses a comprehensive approach to assess the risks associated with ICSs and develop strategies for mitigating those risks. This paper proposes Bayesian Belief Network (BBN) as a representative of a probabilistic method and show its suitability for an integrated safety and security risk assessment. The method is evaluated by means of a use case. It provides risk propagation of functional safety, human safety and shows a propagation path from security to functional safety. The assessment is based on practical vulnerability assessments, technical documentations, manual observation and expert opinions.
en
dc.language.iso
en
-
dc.subject
assessment
en
dc.subject
Bayesian belief networks
en
dc.subject
industrial control system
en
dc.subject
Risk
en
dc.subject
safety
en
dc.subject
security
en
dc.title
Integrated Safety-Security Risk Assessment for Production Systems: A Use Case Using Bayesian Belief Networks
en
dc.type
Inproceedings
en
dc.type
Konferenzbeitrag
de
dc.relation.publication
2023 IEEE 21st International Conference on Industrial Informatics (INDIN)
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dc.relation.isbn
978-1-6654-9313-0
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dc.relation.doi
10.1109/INDIN51400.2023
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dc.relation.issn
1935-4576
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dc.type.category
Full-Paper Contribution
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dc.relation.eissn
2378-363X
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tuw.booktitle
2023 IEEE 21st International Conference on Industrial Informatics (INDIN)
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tuw.container.volume
2023-July
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tuw.peerreviewed
true
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tuw.relation.publisher
IEEE
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tuw.researchTopic.id
C4
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tuw.researchTopic.id
C6
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tuw.researchTopic.name
Mathematical and Algorithmic Foundations
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tuw.researchTopic.name
Modeling and Simulation
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tuw.researchTopic.value
50
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tuw.researchTopic.value
50
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tuw.publication.orgunit
E191-03 - Forschungsbereich Automation Systems
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tuw.publication.orgunit
E384-01 - Forschungsbereich Software-intensive Systems
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tuw.publisher.doi
10.1109/INDIN51400.2023.10217926
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dc.description.numberOfPages
6
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tuw.author.orcid
0000-0001-5420-404X
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tuw.event.name
21st International Conference on Industrial Informatics (INDIN)
en
tuw.event.startdate
18-07-2023
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tuw.event.enddate
20-07-2023
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tuw.event.online
On Site
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tuw.event.type
Event for scientific audience
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tuw.event.place
Lemgo
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tuw.event.country
DE
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tuw.event.presenter
Bhosale, Pushparaj
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tuw.event.track
Multi Track
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wb.sciencebranch
Informatik
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wb.sciencebranch
Elektrotechnik, Elektronik, Informationstechnik
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wb.sciencebranch
Mathematik
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wb.sciencebranch.oefos
1020
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wb.sciencebranch.oefos
2020
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wb.sciencebranch.oefos
1010
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wb.sciencebranch.value
50
-
wb.sciencebranch.value
40
-
wb.sciencebranch.value
10
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item.languageiso639-1
en
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item.openairetype
conference paper
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item.grantfulltext
restricted
-
item.fulltext
no Fulltext
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item.cerifentitytype
Publications
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item.openairecristype
http://purl.org/coar/resource_type/c_5794
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crisitem.author.dept
E191-03 - Forschungsbereich Automation Systems
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crisitem.author.dept
E640 - Vizerektorat Digitalisierung und Infrastruktur
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crisitem.author.dept
E384 - Institut für Computertechnik
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crisitem.author.orcid
0000-0001-5760-2342
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crisitem.author.orcid
0000-0001-5420-404X
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crisitem.author.orcid
0000-0003-1559-8394
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crisitem.author.parentorg
E191 - Institut für Computer Engineering
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crisitem.author.parentorg
E000 - Technische Universität Wien
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crisitem.author.parentorg
E350 - Fakultät für Elektrotechnik und Informationstechnik