<div class="csl-bib-body">
<div class="csl-entry">Hackl, T., Poik, M., & Schitter, G. (2024). Single-Harmonic Response Open-Loop Kelvin-Probe Force Microscopy. <i>IEEE Transactions on Instrumentation and Measurement</i>, <i>73</i>, 1–7. https://doi.org/10.1109/TIM.2024.3366573</div>
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dc.identifier.issn
0018-9456
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/194685
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dc.description.abstract
The measurement of electrical surface charges and their associated potentials at the nanoscale plays a crucial role in understanding important molecular processes, such as corrosion or biological tissue interactions. Measurement of these potential distributions, especially in aqueous environments, is not always possible with standard atomic force microscopy (AFM)-based techniques. The herein proposed single-harmonic response open-loop Kelvin-probe force microscopy (SH-KPFM) mode circumvents issues of common methods and enables such investigations in water via a suitable choice of the electrical excitation signal. The mode is validated using parameter sweeps on calibration samples and compared to conventional KPFM in air. Furthermore, SH-KPFM is applied to investigate the potential distribution and time-dependent depolarization of a charged PMMA surface immersed in deionized water, demonstrating its ability to analyze complex electrostatic interactions on the nanoscale.
en
dc.language.iso
en
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dc.publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
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dc.relation.ispartof
IEEE Transactions on Instrumentation and Measurement
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dc.subject
Kelvin-probe Force Microscopy
en
dc.subject
surface charge
en
dc.subject
solid-liquid interface
en
dc.subject
PMMA
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dc.subject
aqueous solution
en
dc.title
Single-Harmonic Response Open-Loop Kelvin-Probe Force Microscopy
en
dc.type
Article
en
dc.type
Artikel
de
dc.description.startpage
1
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dc.description.endpage
7
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dc.type.category
Original Research Article
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tuw.container.volume
73
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tuw.journal.peerreviewed
true
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tuw.peerreviewed
true
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tuw.researchTopic.id
C4
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tuw.researchTopic.id
I8
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tuw.researchTopic.name
Mathematical and Algorithmic Foundations
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tuw.researchTopic.name
Sensor Systems
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tuw.researchTopic.value
50
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tuw.researchTopic.value
50
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dcterms.isPartOf.title
IEEE Transactions on Instrumentation and Measurement