<div class="csl-bib-body">
<div class="csl-entry">Taghizadeh, L. (2024). A pCN-MCMC Method for a Bayesian Inverse Problem in Nanoscale Devices. In <i>SIAM 2024 Searchable Abstracts Document: SIAM Conference on Uncertainty Quantification (UQ24)</i> (pp. 124–124). SIAM.</div>
</div>
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/195709
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dc.description.sponsorship
FWF - Österr. Wissenschaftsfonds
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dc.language.iso
en
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dc.subject
Uncertainty Quantification
en
dc.subject
Bayesian Inverse Problems
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dc.subject
Semiconductor Devices
en
dc.title
A pCN-MCMC Method for a Bayesian Inverse Problem in Nanoscale Devices