<div class="csl-bib-body">
<div class="csl-entry">Sokolovic, I., Rasouli, S., Wu, B., Sofer, Z., Matković, A., Schmid, M., Diebold, U., & Grasser, T. (2024, March 19). <i>PtSe₂ vdW single-crystal surfaces studied at the atomic scale with ncAFM</i> [Conference Presentation]. 87. Jahrestagung der DPG und DPG-Frühjahrstagung, Berlin, Germany. http://hdl.handle.net/20.500.12708/196026</div>
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/196026
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dc.description.abstract
Surfaces of van-der-Waals-bonded (vdW) single-crystal PtSe2 cleaved in ultrahigh vacuum (UHV) were studied with noncontact atomic force microscopy (ncAFM) at the atomic level. Typical ionic and electronic defects were characterized with single-atom precision: the identification of surface and subsurface defects was achieved by observing the atomic and electronic structure in parallel. The metallic single crystals exhibit a proclivity of the PtSe2 toward different defect types compared to the synthesized trilayer thin films of semiconducting PtSe2 and other Pt-based TMDs. Cleaved surfaces are representative of the commonly exfoliated flakes so further experiments with in situ deliberate stoichiometry adjustments and the adsorption of gasses will be presented. Additionally, the growth of a CaF2 dielectric on these surfaces will be demonstrated.
en
dc.language.iso
en
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dc.subject
Surface Physics
en
dc.title
PtSe₂ vdW single-crystal surfaces studied at the atomic scale with ncAFM
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dc.type
Presentation
en
dc.type
Vortrag
de
dc.contributor.affiliation
University of Chemistry and Technology, Prague, Czechia
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dc.contributor.affiliation
University of Chemistry and Technology, Prague, Czechia
