<div class="csl-bib-body">
<div class="csl-entry">Ravichandran, H., Knobloch, T., Pannone, A., Karl, A., Stampfer, B., Waldhör, D., Zheng, Y., Sakib, N., Karim Sadaf, M., Pendurthi, R., Torsi, R., Robinson, J. A., Grasser, T., & Das, S. (2023). Observation of Rich Defect Dynamics in Monolayer MoS₂. <i>ACS Nano</i>, <i>17</i>(15), 14449–14460. https://doi.org/10.1021/acsnano.2c12900</div>
</div>
-
dc.identifier.issn
1936-0851
-
dc.identifier.uri
http://hdl.handle.net/20.500.12708/196186
-
dc.description.sponsorship
European Commission
-
dc.language.iso
en
-
dc.publisher
AMER CHEMICAL SOC
-
dc.relation.ispartof
ACS Nano
-
dc.subject
random telegraph signals
en
dc.subject
MoS2
en
dc.subject
Al2O3
en
dc.subject
defects
en
dc.subject
field-effect transistors
en
dc.subject
charge trapping,
en
dc.subject
reliability
en
dc.title
Observation of Rich Defect Dynamics in Monolayer MoS₂
en
dc.type
Article
en
dc.type
Artikel
de
dc.description.startpage
14449
-
dc.description.endpage
14460
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dc.relation.grantno
101021351
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dc.type.category
Original Research Article
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tuw.container.volume
17
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tuw.container.issue
15
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tuw.journal.peerreviewed
true
-
tuw.peerreviewed
true
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wb.publication.intCoWork
International Co-publication
-
tuw.project.title
Fluoride für die nächste Generation von 2D Nanoelektronik
-
tuw.researchinfrastructure
Vienna Scientific Cluster
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tuw.researchTopic.id
Q4
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tuw.researchTopic.id
C6
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tuw.researchTopic.name
Nanoelectronics
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tuw.researchTopic.name
Modeling and Simulation
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tuw.researchTopic.value
70
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tuw.researchTopic.value
30
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dcterms.isPartOf.title
ACS Nano
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tuw.publication.orgunit
E360 - Institut für Mikroelektronik
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tuw.publisher.doi
10.1021/acsnano.2c12900
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dc.identifier.eissn
1936-086X
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dc.description.numberOfPages
12
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tuw.author.orcid
0000-0001-5156-9510
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tuw.author.orcid
0000-0001-5424-7488
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wb.sci
true
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wb.sciencebranch
Elektrotechnik, Elektronik, Informationstechnik
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wb.sciencebranch.oefos
2020
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wb.sciencebranch.value
100
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en
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research article
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restricted
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no Fulltext
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Publications
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http://purl.org/coar/resource_type/c_2df8fbb1
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crisitem.author.dept
E360-01 - Forschungsbereich Mikroelektronik
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E360-01 - Forschungsbereich Mikroelektronik
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crisitem.author.dept
E360-01 - Forschungsbereich Mikroelektronik
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crisitem.author.dept
E360-01 - Forschungsbereich Mikroelektronik
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E360 - Institut für Mikroelektronik
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0000-0001-5156-9510
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0000-0001-5424-7488
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E360 - Institut für Mikroelektronik
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E360 - Institut für Mikroelektronik
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E360 - Institut für Mikroelektronik
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crisitem.author.parentorg
E360 - Institut für Mikroelektronik
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E350 - Fakultät für Elektrotechnik und Informationstechnik
