<div class="csl-bib-body">
<div class="csl-entry">Tselios, K., Knobloch, T., Michl, J. D., Waldhör, D., Schleich, C., Ioannidis, E., Enichlmair, H., Minixhofer, R., Grasser, T., & Waltl, M. (2022). Impact of Single Defects on NBTI and PBTI Recovery in SiO₂ Transistors. In <i>Proceedings 2022 IEEE International Integrated Reliability Workshop (IIRW)</i> (pp. 1–5). https://doi.org/10.1109/IIRW56459.2022.10032748</div>
</div>
-
dc.identifier.uri
http://hdl.handle.net/20.500.12708/196192
-
dc.description.sponsorship
Christian Doppler Forschungsgesells
-
dc.language.iso
en
-
dc.subject
Negative bias temperature instability
en
dc.subject
Silicon compounds
en
dc.subject
Thermal variables control
en
dc.subject
Current measurement
en
dc.subject
Exponential distribution
en
dc.subject
Threshold voltage
en
dc.subject
Nanoscale devices
en
dc.subject
Single defects
en
dc.subject
Charge Trapping
en
dc.subject
Positive and negative bias temperature instability (PBTI, NBTI)
en
dc.subject
Complementary cumulative distribution function (CCDF)
en
dc.subject
Exponential step height distribution
en
dc.title
Impact of Single Defects on NBTI and PBTI Recovery in SiO₂ Transistors
en
dc.type
Inproceedings
en
dc.type
Konferenzbeitrag
de
dc.relation.isbn
978-1-6654-5368-4
-
dc.description.startpage
1
-
dc.description.endpage
5
-
dc.relation.grantno
00000000
-
dc.type.category
Full-Paper Contribution
-
tuw.booktitle
Proceedings 2022 IEEE International Integrated Reliability Workshop (IIRW)
-
tuw.peerreviewed
true
-
tuw.project.title
CD-Labor für Einzeldefektspektroskopie in Halbleiterbauelementen
-
tuw.researchinfrastructure
Zentrum für Mikro & Nanostrukturen
-
tuw.researchTopic.id
M2
-
tuw.researchTopic.id
Q4
-
tuw.researchTopic.name
Materials Characterization
-
tuw.researchTopic.name
Nanoelectronics
-
tuw.researchTopic.value
50
-
tuw.researchTopic.value
50
-
tuw.publication.orgunit
E360 - Institut für Mikroelektronik
-
tuw.publisher.doi
10.1109/IIRW56459.2022.10032748
-
dc.description.numberOfPages
5
-
tuw.author.orcid
0000-0001-5156-9510
-
tuw.event.name
2022 IEEE International Integrated Reliability Workshop (IIRW)
en
tuw.event.startdate
09-10-2022
-
tuw.event.enddate
14-10-2022
-
tuw.event.online
On Site
-
tuw.event.type
Event for scientific audience
-
tuw.event.place
Fallen Leaf Lake, CA
-
tuw.event.country
US
-
tuw.event.presenter
Tselios, Konstantinos
-
wb.sciencebranch
Elektrotechnik, Elektronik, Informationstechnik
-
wb.sciencebranch.oefos
2020
-
wb.sciencebranch.value
100
-
item.languageiso639-1
en
-
item.openairetype
conference paper
-
item.grantfulltext
restricted
-
item.fulltext
no Fulltext
-
item.cerifentitytype
Publications
-
item.openairecristype
http://purl.org/coar/resource_type/c_5794
-
crisitem.author.dept
E360-01 - Forschungsbereich Mikroelektronik
-
crisitem.author.dept
E360-01 - Forschungsbereich Mikroelektronik
-
crisitem.author.dept
E360-01 - Forschungsbereich Mikroelektronik
-
crisitem.author.dept
E360-01 - Forschungsbereich Mikroelektronik
-
crisitem.author.dept
E360-01 - Forschungsbereich Mikroelektronik
-
crisitem.author.dept
AMS (Austria)
-
crisitem.author.dept
AMS (Austria)
-
crisitem.author.dept
AMS (Austria)
-
crisitem.author.dept
E360 - Institut für Mikroelektronik
-
crisitem.author.dept
E360-01 - Forschungsbereich Mikroelektronik
-
crisitem.author.orcid
0000-0001-5156-9510
-
crisitem.author.orcid
0000-0002-8631-5681
-
crisitem.author.orcid
0000-0001-6042-759X
-
crisitem.author.parentorg
E360 - Institut für Mikroelektronik
-
crisitem.author.parentorg
E360 - Institut für Mikroelektronik
-
crisitem.author.parentorg
E360 - Institut für Mikroelektronik
-
crisitem.author.parentorg
E360 - Institut für Mikroelektronik
-
crisitem.author.parentorg
E360 - Institut für Mikroelektronik
-
crisitem.author.parentorg
E350 - Fakultät für Elektrotechnik und Informationstechnik
