<div class="csl-bib-body">
<div class="csl-entry">Stöger-Pollach, M., Becer, F., & Scales, Z. (2024). Beam damage free sample investigations of GaN related materials employing cathodoluminescence. In G. Leitinger, G. Kothleitner, & Österreichische Gesellschaft für Elektronenmikroskopie (Eds.), <i>14th ASEM Workshop on Advanced Electron Microscopy</i> (pp. 87–87). https://doi.org/10.34726/6359</div>
</div>
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http://hdl.handle.net/20.500.12708/197700
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dc.identifier.uri
https://doi.org/10.34726/6359
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dc.language.iso
en
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dc.rights.uri
http://rightsstatements.org/vocab/InC/1.0/
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dc.subject
STEM
en
dc.subject
Beam damage
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dc.title
Beam damage free sample investigations of GaN related materials employing cathodoluminescence
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dc.type
Inproceedings
en
dc.type
Konferenzbeitrag
de
dc.rights.license
Urheberrechtsschutz
de
dc.rights.license
In Copyright
en
dc.identifier.doi
10.34726/6359
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dc.contributor.affiliation
TU Wien, Austria
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dc.contributor.affiliation
Kompetenzzentrum Autombil- und Industrieelektronik GmbH, Austria
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dc.contributor.editoraffiliation
Graz University of Technology, Austria
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dc.description.startpage
87
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dc.description.endpage
87
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dc.type.category
Abstract Book Contribution
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tuw.booktitle
14th ASEM Workshop on Advanced Electron Microscopy
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Universitäre Service-Einrichtung für Transmissionselektronenmikroskopie
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M2
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tuw.researchTopic.id
M5
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tuw.researchTopic.id
Q2
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tuw.researchTopic.name
Materials Characterization
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tuw.researchTopic.name
Composite Materials
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Quantum Metrology and Precision Measurements
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30
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tuw.researchTopic.value
50
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20
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E057-02 - Fachbereich Universitäre Serviceeinrichtung für Transmissions- Elektronenmikroskopie
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AC17207701
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1
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0000-0002-5450-4621
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Urheberrechtsschutz
de
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In Copyright
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14th ASEM Workshop on Advanced Electron Microscopy (ASEM 2024)
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tuw.event.startdate
04-04-2024
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tuw.event.enddate
05-04-2024
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On Site
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Event for scientific audience
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Graz
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AT
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tuw.event.presenter
Stöger-Pollach, Michael
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Physik, Astronomie
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1030
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100
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Österreichische Gesellschaft für Elektronenmikroskopie
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Publications
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en
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application/pdf
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with Fulltext
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conference paper
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Open Access
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http://purl.org/coar/resource_type/c_5794
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open
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E057-02 - Fachbereich Universitäre Serviceeinrichtung für Transmissions- Elektronenmikroskopie
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crisitem.author.dept
TU Wien
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crisitem.author.dept
Kompetenzzentrum Autombil- und Industrieelektronik GmbH, Austria
