<div class="csl-bib-body">
<div class="csl-entry">Colla, M.-S., Naceri, S. E., Roisin, N., Baral, P., Coulombier, M., Idrissi, H., Flandre, D., Raskin, J.-P., & Pardoen, T. (2024). New developments of the residual stress actuated on-chip testing method. In <i>MecaNano 2nd General Meeting : Final Program</i>. MecaNano 2nd General Meeting, Austria. https://doi.org/10.34726/6587</div>
</div>
-
dc.identifier.uri
http://hdl.handle.net/20.500.12708/198373
-
dc.identifier.uri
https://doi.org/10.34726/6587
-
dc.language.iso
en
-
dc.rights.uri
http://creativecommons.org/licenses/by/4.0/
-
dc.subject
micromechanics
en
dc.title
New developments of the residual stress actuated on-chip testing method