<div class="csl-bib-body">
<div class="csl-entry">Setvin, M., Wagner, M., Schmid, M., Parkinson, G., & Diebold, U. (2017). Surface point defects on bulk oxides: atomically-resolved scanning probe microscopy. <i>Chemical Society Reviews</i>, <i>46</i>, 1772–1784. https://doi.org/10.1039/c7cs00076f</div>
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dc.identifier.issn
0306-0012
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/20234
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dc.description.abstract
Metal oxides are abundant in nature and they are some of the most versatile materials for applications ranging from catalysis to novel electronics. The physical and chemical properties of metal oxides are dramatically influenced, and can be judiciously tailored, by defects. Small changes in stoichiometry introduce so-called intrinsic defects, e.g., atomic vacancies and/or interstitials. This review gives an overview of using Scanning Probe Microscopy (SPM), in particular Scanning Tunneling Microscopy (STM), to study the changes in the local geometric and electronic structure related to these intrinsic point defects at the surfaces of metal oxides. Three prototypical systems are discussed: titanium dioxide (TiO2), iron oxides (Fe3O4), and, as an example for a post-transition-metal oxide, indium oxide (In2O3). Each of these three materials prefers a different type of surface point defect: oxygen vacancies, cation vacancies, and cation adatoms, respectively. The different modes of STM imaging and the promising capabilities of non-contact Atomic Force Microscopy (nc-AFM) techniques are discussed, as well as the capability of STM to manipulate single point defects.
en
dc.description.sponsorship
Fonds zur Förderung der wissenschaftlichen Forschung (FWF)
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dc.description.sponsorship
Fonds zur Förderung der wissenschaftlichen Forschung (FWF)
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dc.language.iso
en
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dc.publisher
ROYAL SOC CHEMISTRY
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dc.relation.ispartof
Chemical Society Reviews
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dc.rights.uri
http://creativecommons.org/licenses/by/4.0/
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dc.subject
Surface defects
en
dc.title
Surface point defects on bulk oxides: atomically-resolved scanning probe microscopy