<div class="csl-bib-body">
<div class="csl-entry">Gitschthaler, A., Hahn, R., Zauner, L., Wojcik, T., Fahrnberger, F., Hutter, H., Jerg, C., Ramm, J., Eriksson, A., Kolozsvari, S., Polcik, P., & Riedl-Tragenreif, H. (2024, June 11). <i>Residual stress based improvement of the fatigue life of Ti-Al-N coated Ti-6Al-4V</i> [Conference Presentation]. ÖGV Seminar 2024, Villach, Austria. http://hdl.handle.net/20.500.12708/204897</div>
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/204897
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dc.description.abstract
For titanium alloys in high-temperature tribological contacts, titanium aluminum nitride (TiAlN) based coatings have proven to be an effective surface strengthening technique. However, there are conflicting results on how the deposition of such a ceramic coating affects the fatigue behavior of the underlying metallic titanium substrate. To address these shortcomings, a comprehensive study of two different synthesis approaches (varying stress states and an adapted alloying strategy for the coating material) was performed using a dynamic mechanical analyzer in a single cantilever configuration. As a result, the high-cycle fatigue limit of the material pairing was improved by up to 50% compared to the uncoated titanium alloy.
en
dc.description.sponsorship
Christian Doppler Forschungsgesells
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dc.language.iso
en
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dc.subject
Fatigue
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dc.subject
Physical Vapor Deposition
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dc.subject
Thin films
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dc.subject
Residual Stresses
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dc.title
Residual stress based improvement of the fatigue life of Ti-Al-N coated Ti-6Al-4V
en
dc.type
Presentation
en
dc.type
Vortrag
de
dc.contributor.affiliation
Oerlikon (Switzerland), Switzerland
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dc.contributor.affiliation
Oerlikon (Liechtenstein), Liechtenstein
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dc.contributor.affiliation
Plansee (Germany), Germany
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dc.relation.grantno
CDL-SEC
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dc.rights.holder
Arno Gitschthaler
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dc.type.category
Conference Presentation
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tuw.project.title
Oberflächentechnik von hochbeanspruchten Präzisionskomponenten
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tuw.researchinfrastructure
Röntgenzentrum
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tuw.researchinfrastructure
Universitäre Service-Einrichtung für Transmissionselektronenmikroskopie