<div class="csl-bib-body">
<div class="csl-entry">Magerl, A., Lemmel, H., Appel, M., Matthias Weißer, Ulrich Kretzer, & Zobel, M. (2024). The promise of GaAs 200 in small-angle neutron scattering for higher resolution. <i>Journal of Applied Crystallography</i>, <i>57</i>(5), 1282–1287. https://doi.org/10.1107/S1600576724007246</div>
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dc.identifier.issn
1600-5767
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/205944
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dc.description.abstract
The Q resolution in Bonse-Hart double-crystal diffractometers is determined for a given Bragg angle by the value of the crystallographic structure factor. To date, the reflections Si 220 or Si 111 have been used exclusively in neutron scattering, which provide resolutions for triple-bounce crystals of about 2×10⁻⁵Å⁻¹ (FWHM). The Darwin width of the GaAs 200 reflection is about a factor of 10 smaller, offering the possibility of a Q resolution of 2×10⁻⁶Å⁻¹ provided crystals of sufficient quality are available. This article reports a feasibility study with single-bounce GaAs 200, yielding a Q resolution of 4.6×10⁻⁶Å⁻¹, six times superior in comparison with a Si 220 setup.
en
dc.language.iso
en
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dc.publisher
INT UNION CRYSTALLOGRAPHY
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dc.relation.ispartof
Journal of Applied Crystallography
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dc.subject
Bonse-Hart diffractometer
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dc.subject
GaAs 200
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dc.subject
ultra-small-angle neutron diffraction
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dc.subject
USANS
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dc.title
The promise of GaAs 200 in small-angle neutron scattering for higher resolution