<div class="csl-bib-body">
<div class="csl-entry">Wobrauschek, P., Hradil, K., Ingerle, D., & Streli, C. (2023). <i>XRF of Layered Structures</i> [Conference Presentation]. Denver X-ray Conference 2023, Lombard, United States of America (the).</div>
</div>
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/207024
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dc.description
Micro XRF and Synchrotron Applications
In the second part, GIXA, Dieter Ingerle will present the combination of Grazing incidence XRF (GIXRF) and X-ray reflectivity (XRR).
GIXA allows the characterization of nanometer layers, the determination of the elemental composition, density and thickness.
Setups, data evaluation software and showcases are presented.
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dc.description.abstract
MicroIn the second part, GIXA, Dieter Ingerle will present the combination of Grazing incidence XRF (GIXRF) and X-ray reflectivity (XRR).
GIXA allows the characterization of nanometer layers, the determination of the elemental composition, density and thickness.
Setups, data evaluation software and showcases are presented. XRF and Synchrotron Applications
