<div class="csl-bib-body">
<div class="csl-entry">Frank, A., Cook, P. K., Hradil, K., Ingerle, D., Kerber, M., Lichtenegger, H., & Streli, C. (2024, June 26). <i>Elemental Mapping using lab-based Full Field Fluorescence imaging</i> [Conference Presentation]. European Conference on X-Ray Spectrometry (EXRS), Athens, Greece. http://hdl.handle.net/20.500.12708/208315</div>
</div>
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/208315
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dc.description.abstract
With the increasing fidelity of modern, pixelated CCD-based X-ray detectors, which provide direct detection of X-rays with both energy and spatial resolution, new techniques in the field of X-ray analytical methods have become possible. Elemental Mapping can be performed by Full Field X-ray Fluorescence analysis [1] where the whole sample is illuminated by an X-ray beam and – via an appropriate optic between sample and detector - yields an image directly on the detector screen. As every pixel yields a full X-ray spectrum the image can be interpreted as an Elemental Map of the sample
Here, a novel instrument, the X-ray Color Camera microscope, based on a one megapixel pnCCD detector [2] with a pixel size of 75*75µm, a readout rate of up to 400 Hz and an energy resolution of 160 eV at 6 keV for every pixel, will be used together with a lab X-ray source to showcase this technique. With a simple pinhole as the imaging optic, mounted on a movable arm, different magnifications can be realized by just changing the distance between sample and optics. A variety of samples will be shown to emphasize the viability of this technique.
[1] U. Fittschen, O. Scharf and M. Menzel, Full-Field X-ray Fluorescence Microscopy Using a Color
X-ray Camera, Microscopy Today 23(3),2015, 36
[2] Lothar Strüder, et al. Large-format, high-speed, X-ray pnCCDs combined with electron and ion imaging spectrometers in a multipurpose chamber for experiments at 4th generation light sources, Nucl. Instrum. Methods Phys. Res. Sect. A (214), 2010, 483 – 496.
en
dc.language.iso
en
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dc.subject
XRF imaging
en
dc.title
Elemental Mapping using lab-based Full Field Fluorescence imaging
en
dc.type
Presentation
en
dc.type
Vortrag
de
dc.contributor.affiliation
Danish Technological Institute, Denmark
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dc.contributor.affiliation
BOKU University, Austria
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dc.contributor.affiliation
BOKU University, Austria
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dc.type.category
Conference Presentation
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tuw.researchinfrastructure
Röntgenzentrum
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tuw.researchTopic.id
M2
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tuw.researchTopic.name
Materials Characterization
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tuw.researchTopic.value
100
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tuw.publication.orgunit
E141 - Atominstitut
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tuw.publication.orgunit
E057-04 - Fachbereich Röntgenzentrum
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tuw.author.orcid
0000-0002-8372-4543
-
tuw.author.orcid
0000-0001-5714-4257
-
tuw.author.orcid
0000-0002-6989-2495
-
tuw.author.orcid
0000-0003-2686-7641
-
tuw.author.orcid
0000-0003-2653-5196
-
tuw.author.orcid
0000-0002-6624-1419
-
tuw.author.orcid
0000-0002-5141-3177
-
tuw.event.name
European Conference on X-Ray Spectrometry (EXRS)
en
tuw.event.startdate
24-06-2024
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tuw.event.enddate
28-06-2024
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tuw.event.online
On Site
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tuw.event.type
Event for scientific audience
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tuw.event.place
Athens
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tuw.event.country
GR
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tuw.event.institution
National Centre for Scientific Research "Demokritos"
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tuw.event.presenter
Frank, Arno
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wb.sciencebranch
Physik, Astronomie
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wb.sciencebranch.oefos
1030
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wb.sciencebranch.value
100
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item.openairetype
conference paper not in proceedings
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item.cerifentitytype
Publications
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item.grantfulltext
none
-
item.languageiso639-1
en
-
item.openairecristype
http://purl.org/coar/resource_type/c_18cp
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item.fulltext
no Fulltext
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crisitem.author.dept
E057-04 - Fachbereich Röntgenzentrum
-
crisitem.author.dept
Danish Technological Institute
-
crisitem.author.dept
E057-04 - Fachbereich Röntgenzentrum
-
crisitem.author.dept
E057-04 - Fachbereich Röntgenzentrum
-
crisitem.author.dept
BOKU University
-
crisitem.author.dept
E308 - Institut für Werkstoffwissenschaft und Werkstofftechnologie
-
crisitem.author.dept
E057-04 - Fachbereich Röntgenzentrum
-
crisitem.author.orcid
0000-0002-8372-4543
-
crisitem.author.orcid
0000-0001-5714-4257
-
crisitem.author.orcid
0000-0002-6989-2495
-
crisitem.author.orcid
0000-0003-2686-7641
-
crisitem.author.orcid
0000-0003-2653-5196
-
crisitem.author.orcid
0000-0002-5141-3177
-
crisitem.author.parentorg
E057 - Facilities und Zentren
-
crisitem.author.parentorg
E057 - Facilities und Zentren
-
crisitem.author.parentorg
E057 - Facilities und Zentren
-
crisitem.author.parentorg
E300 - Fakultät für Maschinenwesen und Betriebswissenschaften
