<div class="csl-bib-body">
<div class="csl-entry">Wahid, S. N., Leitgeb, M., Pfusterschmied, G., & Schmid, U. (2024). A Novel Approach for Thin 4H-SiC Foil Realization Using Controlled Spalling from a 4H-SiC Wafer. <i>Materials Science Forum</i>, <i>1124</i>, 35–41. https://doi.org/10.4028/p-8AEonP</div>
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dc.identifier.issn
0255-5476
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/208741
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dc.description.abstract
Porosifying the surface of a single crystalline silicon carbide (4H-SiC) wafer with the means of metal assisted photo chemical etching (MAPCE) promotes the adhesion of an electroplated nickel (Ni) layer. By utilizing a mechanical peel-off process, a Ni layer with tailored mechanical stress is peeled off such that also a thin layer of 4H-SiC is teared apart from the wafer as well.
en
dc.language.iso
en
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dc.publisher
Trans Tech Publications Ltd.
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dc.relation.ispartof
Materials Science Forum
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dc.rights.uri
http://creativecommons.org/licenses/by/4.0/
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dc.subject
4H-SiC
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dc.subject
Controlled Spalling
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dc.subject
MAPCE
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dc.subject
Ni Plating
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dc.subject
Thin Foil
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dc.title
A Novel Approach for Thin 4H-SiC Foil Realization Using Controlled Spalling from a 4H-SiC Wafer