<div class="csl-bib-body">
<div class="csl-entry">Muzammil, M., Zarepakzad, S., Ali, B., Bostan Shirin, M., Kerimzade, U., & Alaca, B. E. (2024). Investigating Stress-Induced Change in Resonant Frequency of Silicon Nanowires. In A. Kocabaş & C. Kocabaş (Eds.), <i>NANOTR-18 : Books of Abtracts</i> (pp. 76–76). http://hdl.handle.net/20.500.12708/210490</div>
</div>
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/210490
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dc.language.iso
en
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dc.subject
Silicon Nanowires
en
dc.subject
Resonant Frequency
en
dc.subject
Stress-Induced Change
en
dc.title
Investigating Stress-Induced Change in Resonant Frequency of Silicon Nanowires
en
dc.type
Inproceedings
en
dc.type
Konferenzbeitrag
de
dc.contributor.affiliation
Koç University, Turkey
-
dc.contributor.affiliation
Koç University, Turkey
-
dc.contributor.affiliation
Koç University, Turkey
-
dc.contributor.affiliation
Koç University, Turkey
-
dc.contributor.affiliation
Koç University, Turkey
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dc.description.startpage
76
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dc.description.endpage
76
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dc.type.category
Abstract Book Contribution
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tuw.booktitle
NANOTR-18 : Books of Abtracts
-
tuw.peerreviewed
true
-
tuw.researchTopic.id
M2
-
tuw.researchTopic.id
I8
-
tuw.researchTopic.name
Materials Characterization
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tuw.researchTopic.name
Sensor Systems
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tuw.researchTopic.value
50
-
tuw.researchTopic.value
50
-
tuw.publication.orgunit
E366-02 - Forschungsbereich Mikrosystemtechnik
-
dc.description.numberOfPages
1
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tuw.author.orcid
0009-0003-3649-2756
-
tuw.author.orcid
0000-0002-7029-4812
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tuw.author.orcid
0000-0002-5807-3160
-
tuw.author.orcid
0000-0002-2712-1908
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tuw.author.orcid
0000-0001-5931-8134
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tuw.event.name
NANOTR-18: 18th Nanoscience and Nanotechnology Conference