<div class="csl-bib-body">
<div class="csl-entry">Hahn, R., Janknecht, R., Koutna, N., Todt, J., Meindlhumer, M., Davydok, A., Kolozsvári, S., Keckes, J., Mayrhofer, P. H., & Riedl, H. (2024, June 19). <i>Measuring Thin Film Elastic Constants using Combined X-ray Microdiffraction and Micromechanical Testing</i> [Conference Presentation]. 6th ICASS, Wuzhen, China. http://hdl.handle.net/20.500.12708/210855</div>
</div>
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/210855
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dc.description.sponsorship
Christian Doppler Forschungsgesells
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dc.language.iso
en
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dc.subject
Elastic constants
en
dc.subject
Synchrotron Diffraction
en
dc.subject
Micropillar Compression
en
dc.subject
Hard coating
en
dc.subject
Density Functional Theory (DFT)
en
dc.title
Measuring Thin Film Elastic Constants using Combined X-ray Microdiffraction and Micromechanical Testing
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dc.type
Presentation
en
dc.type
Vortrag
de
dc.contributor.affiliation
Montanuniversität Leoben, Austria
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dc.contributor.affiliation
Montanuniversität Leoben, Austria
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dc.contributor.affiliation
Helmholtz-Zentrum Hereon, Germany
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dc.contributor.affiliation
Plansee (Germany), Germany
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dc.relation.grantno
CDL-SEC
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dc.type.category
Conference Presentation
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tuw.project.title
Oberflächentechnik von hochbeanspruchten Präzisionskomponenten
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tuw.researchinfrastructure
Röntgenzentrum
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tuw.researchinfrastructure
Universitäre Service-Einrichtung für Transmissionselektronenmikroskopie
