DC Field
Value
Language
dc.contributor.author
Bianchi, D.
-
dc.contributor.author
Vernes, Andras
-
dc.contributor.author
Vorlaufer, G.
-
dc.contributor.author
Betz, G.
-
dc.contributor.editor
Gorecki, Christophe
-
dc.contributor.editor
Asundi, Anand
-
dc.contributor.editor
Osten, Wolfgang
-
dc.date.accessioned
2025-02-11T10:11:25Z
-
dc.date.available
2025-02-11T10:11:25Z
-
dc.date.issued
2010
-
dc.identifier.citation
<div class="csl-bib-body"> <div class="csl-entry">Bianchi, D., Vernes, A., Vorlaufer, G., &#38; Betz, G. (2010). Multiresolution analysis of 2D confocal microscope images. In C. Gorecki, A. Asundi, &#38; W. Osten (Eds.), <i>Optical Micro- and Nanometrology III</i>. https://doi.org/10.1117/12.854498</div> </div>
-
dc.identifier.uri
http://hdl.handle.net/20.500.12708/211568
-
dc.description.abstract
The functionality of the lifting is exploited scheme to analyze several white light confocal images of tribological/ engineering surfaces in terms of their roughness, waviness and form. The roughness parameters obtained are then compared with those resulting from other standard filtering techniques, like Gaussian filtering. Based on the wavelet transform, an attempt will also be made to provide a robust parameter for surface characterization. © 2010 Copyright SPIE - The International Society for Optical Engineering.
en
dc.language.iso
en
-
dc.subject
Lifting Scheme
en
dc.subject
Optical micro-metrology
en
dc.subject
Roughness Parameters
en
dc.subject
Topography
en
dc.subject
Wavelet
en
dc.subject
White Light Confocal Microscope
en
dc.title
Multiresolution analysis of 2D confocal microscope images
en
dc.type
Inproceedings
en
dc.type
Konferenzbeitrag
de
dc.contributor.editoraffiliation
PAN (VARSOVIE, PL)
-
dc.contributor.editoraffiliation
d'Optron Pte Ltd (Singapore, SG)
-
dc.contributor.editoraffiliation
University of Stuttgart, Germany
-
dc.relation.isbn
9780819481917
-
dc.type.category
Full-Paper Contribution
-
tuw.booktitle
Optical Micro- and Nanometrology III
-
tuw.container.volume
7718
-
tuw.peerreviewed
true
-
tuw.researchTopic.id
M1
-
tuw.researchTopic.id
C6
-
tuw.researchTopic.id
C1
-
tuw.researchTopic.name
Surfaces and Interfaces
-
tuw.researchTopic.name
Modeling and Simulation
-
tuw.researchTopic.name
Computational Materials Science
-
tuw.researchTopic.value
20
-
tuw.researchTopic.value
20
-
tuw.researchTopic.value
60
-
tuw.publication.orgunit
E134-02 - Forschungsbereich Applied Interface Physics
-
tuw.publisher.doi
10.1117/12.854498
-
dc.description.numberOfPages
5
-
tuw.editor.orcid
0000-0003-1468-3167
-
tuw.editor.orcid
0000-0003-3835-4624
-
tuw.editor.orcid
0000-0003-3167-6217
-
tuw.event.name
SPIE PHOTONICS EUROPE
en
tuw.event.startdate
12-04-2010
-
tuw.event.enddate
16-04-2010
-
tuw.event.online
On Site
-
tuw.event.type
Event for scientific audience
-
tuw.event.place
Brüssel
-
tuw.event.country
BE
-
tuw.event.presenter
Bianchi, D.
-
wb.sciencebranch
Physik, Astronomie
-
wb.sciencebranch.oefos
1030
-
wb.sciencebranch.value
100
-
item.openairetype
conference paper
-
item.cerifentitytype
Publications
-
item.grantfulltext
none
-
item.languageiso639-1
en
-
item.openairecristype
http://purl.org/coar/resource_type/c_5794
-
item.fulltext
no Fulltext
-
crisitem.author.dept
E134 - Institut für Angewandte Physik
-
crisitem.author.dept
E134 - Institut für Angewandte Physik
-
crisitem.author.parentorg
E130 - Fakultät für Physik
-
crisitem.author.parentorg
E130 - Fakultät für Physik
-
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