<div class="csl-bib-body">
<div class="csl-entry">Gull, J., Filipovic, L., & Kosina, H. (2024). Electron-Electron Scattering in Non-Parabolic Transport Models. In <i>2024 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)</i> (pp. 1–4). https://doi.org/10.1109/SISPAD62626.2024.10733120</div>
</div>
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/212142
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dc.description.abstract
Recently, a Monte Carlo algorithm for the solution of a two-particle kinetic equation has been developed. This equation treats both single-particle scattering mecha-nisms (electron-phonon scattering) and two-particle scat-tering mechanisms (electron-electron scattering) in a consistent manner [GK23]. In this work, we present the extension of the algorithm to non-parabolic bands and discuss a statistical enhancement algorithm.
en
dc.description.sponsorship
Christian Doppler Forschungsgesells
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dc.description.sponsorship
FWF - Österr. Wissenschaftsfonds
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dc.description.sponsorship
FWF - Österr. Wissenschaftsfonds
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dc.language.iso
en
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dc.subject
Electron-electron scattering
en
dc.subject
Non-Parabolic Transport Models
en
dc.subject
Monte Carlo Simulation
en
dc.subject
Semiconductor Device Simulation
en
dc.subject
Scattering Rates
en
dc.title
Electron-Electron Scattering in Non-Parabolic Transport Models
en
dc.type
Inproceedings
en
dc.type
Konferenzbeitrag
de
dc.relation.isbn
979-8-3315-1635-2
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dc.relation.doi
10.1109/SISPAD62626.2024
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dc.description.startpage
1
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dc.description.endpage
4
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dc.relation.grantno
00000
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dc.relation.grantno
P 35318-N
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dc.relation.grantno
DOC 142-N
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dc.type.category
Full-Paper Contribution
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tuw.booktitle
2024 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
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tuw.peerreviewed
true
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tuw.project.title
Multi-Scale-Prozessmodellierung von Halbleiter-Bauelemente und -Sensoren
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tuw.project.title
Adsorbatabhängige elektrische Leitfähigkeit von MoS2-FETs
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tuw.project.title
TUD-X: Anwendungen von 2D Materialien
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tuw.researchTopic.id
Q4
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tuw.researchTopic.id
C6
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tuw.researchTopic.id
C1
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tuw.researchTopic.name
Nanoelectronics
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tuw.researchTopic.name
Modeling and Simulation
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tuw.researchTopic.name
Computational Materials Science
-
tuw.researchTopic.value
30
-
tuw.researchTopic.value
40
-
tuw.researchTopic.value
30
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tuw.publication.orgunit
E360-01 - Forschungsbereich Mikroelektronik
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tuw.publisher.doi
10.1109/SISPAD62626.2024.10733120
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dc.description.numberOfPages
4
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tuw.author.orcid
0000-0003-1687-5058
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tuw.event.name
2024 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
