<div class="csl-bib-body">
<div class="csl-entry">Loesener, M., Zinsler, T., Stampfer, B., Wimmer, F., Ioannidis, E., Monga, U., Pflanzl, W., Minixhofer, R., Grasser, T., & Waltl, M. (2024). Evaluation of the Robustness of the Defect-Centric Model for Defect Parameter Extraction from RTN Analysis. In M. Waltl, F. F. Huemer, & M. Hofbauer (Eds.), <i>2024 Austrochip Workshop on Microelectronics (Austrochip)</i>. IEEE. https://doi.org/10.1109/Austrochip62761.2024.10716231</div>
</div>
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/212514
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dc.description.sponsorship
Christian Doppler Forschungsgesells
-
dc.language.iso
en
-
dc.subject
Transistor Reliability
en
dc.subject
Modeling
en
dc.subject
Noise in Semiconductor Devices
en
dc.subject
Charge Trapping
en
dc.title
Evaluation of the Robustness of the Defect-Centric Model for Defect Parameter Extraction from RTN Analysis
en
dc.type
Inproceedings
en
dc.type
Konferenzbeitrag
de
dc.contributor.affiliation
AMS (Austria), Austria
-
dc.contributor.affiliation
TU Wien, Austria
-
dc.contributor.affiliation
TU Wien, Austria
-
dc.contributor.affiliation
AMS (Austria), Austria
-
dc.contributor.affiliation
AMS (Austria), Austria
-
dc.contributor.affiliation
AMS (Austria), Austria
-
dc.contributor.affiliation
AMS (Austria), Austria
-
dc.contributor.affiliation
TU Wien, Austria
-
dc.relation.isbn
979-8-3315-1617-8
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dc.relation.grantno
00000000
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dc.type.category
Full-Paper Contribution
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tuw.booktitle
2024 Austrochip Workshop on Microelectronics (Austrochip)
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tuw.relation.publisher
IEEE
-
tuw.relation.publisherplace
Vienna, Austria
-
tuw.project.title
CD-Labor für Einzeldefektspektroskopie in Halbleiterbauelementen
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tuw.researchTopic.id
C6
-
tuw.researchTopic.id
C1
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tuw.researchTopic.name
Modeling and Simulation
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tuw.researchTopic.name
Computational Materials Science
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tuw.researchTopic.value
50
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tuw.researchTopic.value
50
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tuw.publication.orgunit
E360-01 - Forschungsbereich Mikroelektronik
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tuw.publication.orgunit
E056-04 - Fachbereich TU-DX: Towards Applications of 2D Materials
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tuw.publisher.doi
10.1109/Austrochip62761.2024.10716231
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dc.description.numberOfPages
4
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tuw.author.orcid
0000-0001-5424-7488
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tuw.editor.orcid
0000-0002-2776-7768
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tuw.event.name
2024 Austrochip Workshop on Microelectronics (Austrochip)
en
tuw.event.startdate
25-09-2024
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tuw.event.enddate
26-09-2024
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tuw.event.online
On Site
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tuw.event.type
Event for scientific audience
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tuw.event.place
Vienna
-
tuw.event.country
AT
-
tuw.event.institution
TU Wien
-
tuw.event.presenter
Loesener, Martin
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tuw.event.track
Multi Track
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wb.sciencebranch
Elektrotechnik, Elektronik, Informationstechnik
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wb.sciencebranch.oefos
2020
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wb.sciencebranch.value
100
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item.cerifentitytype
Publications
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item.fulltext
no Fulltext
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item.openairecristype
http://purl.org/coar/resource_type/c_5794
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item.grantfulltext
restricted
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item.openairetype
conference paper
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item.languageiso639-1
en
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crisitem.author.dept
AMS (Austria)
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crisitem.author.dept
E360-50-2 - Fachgruppe Semiconductor Technology and Simulation
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crisitem.author.dept
E360-01 - Forschungsbereich Mikroelektronik
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crisitem.author.dept
E360-01 - Forschungsbereich Mikroelektronik
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crisitem.author.dept
AMS (Austria)
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crisitem.author.dept
AMS (Austria)
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crisitem.author.dept
AMS (Austria)
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crisitem.author.dept
AMS (Austria)
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crisitem.author.dept
E360 - Institut für Mikroelektronik
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crisitem.author.dept
E360 - Institut für Mikroelektronik
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crisitem.author.orcid
0000-0001-5424-7488
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crisitem.author.orcid
0000-0001-6042-759X
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crisitem.author.parentorg
E360-50 - Services des Instituts
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crisitem.author.parentorg
E360 - Institut für Mikroelektronik
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crisitem.author.parentorg
E360 - Institut für Mikroelektronik
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crisitem.author.parentorg
E350 - Fakultät für Elektrotechnik und Informationstechnik
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crisitem.author.parentorg
E350 - Fakultät für Elektrotechnik und Informationstechnik
