<div class="csl-bib-body">
<div class="csl-entry">Bittner, M., Hauer, D., Wess, M., Schnöll, D., Diwold, K., & Jantsch, A. (2024). Forecasting Load Profiles and Critical Overloads with Uncertainty Quantification for Low Voltage Smart Grids. In <i>2024 8th International Conference on System Reliability and Safety (ICSRS)</i> (pp. 138–147). https://doi.org/10.1109/ICSRS63046.2024.10927481</div>
</div>
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/214068
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dc.description.abstract
Forecasting load profiles and critical overloads is essential to ensure the reliability and safety of Low Voltage Smart Grids. We specifically target to forecast the total grid load, and partial loads by applying an LSTM recurrent neural network combined with quantile uncertainty quantification. The design of the proposed forecasting and uncertainty prediction algorithms allows for tuning the sensitivity of the overload detection and for the deployment to low-cost edge devices. The forecasting algorithms were tested with one-year simulations across six different Smart Grid topologies. Our results demonstrate consistent and robust forecasting performance across various simulations. The overload detection capabilities are analyzed based on a single simulation scenario and show the effectiveness of using different quantile prediction intervals to tune the sensitivity of the overload detection performance.
en
dc.description.sponsorship
Christian Doppler Forschungsgesells
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dc.language.iso
en
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dc.subject
Load Forecasting
en
dc.subject
Uncertainty Quantification
en
dc.subject
Overload Detection
en
dc.subject
Smart Grids
en
dc.title
Forecasting Load Profiles and Critical Overloads with Uncertainty Quantification for Low Voltage Smart Grids
en
dc.type
Inproceedings
en
dc.type
Konferenzbeitrag
de
dc.relation.isbn
979-8-3503-5450-8
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dc.description.startpage
138
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dc.description.endpage
147
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dc.relation.grantno
123456
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dc.rights.holder
The undersigned hereby assigns to The Institute of Electrical and Electronics Engineers, Incorporated (the "IEEE") all rights under
copyright that may exist in and to: (a) the Work, including any revised or expanded derivative works submitted to the IEEE by the
undersigned based on the Work; and (b) any associated written or multimedia components or other enhancements accompanying the
Work.
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dc.type.category
Full-Paper Contribution
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tuw.booktitle
2024 8th International Conference on System Reliability and Safety (ICSRS)
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tuw.peerreviewed
true
-
tuw.project.title
CDL Embedded Machine Learning
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tuw.researchTopic.id
E1
-
tuw.researchTopic.id
I4
-
tuw.researchTopic.name
Energy Active Buildings, Settlements and Spatial Infrastructures
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tuw.researchTopic.name
Information Systems Engineering
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tuw.researchTopic.value
70
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tuw.researchTopic.value
30
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tuw.linking
https://www.icsrs.org/sub.html
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tuw.publication.orgunit
E384-02 - Forschungsbereich Systems on Chip
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tuw.publication.orgunit
E056-10 - Fachbereich SecInt-Secure and Intelligent Human-Centric Digital Technologies
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tuw.publication.orgunit
E056-16 - Fachbereich SafeSeclab
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tuw.publisher.doi
10.1109/ICSRS63046.2024.10927481
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dc.description.numberOfPages
10
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tuw.author.orcid
0009-0004-8022-2232
-
tuw.author.orcid
0000-0002-1877-4114
-
tuw.author.orcid
0009-0009-5834-6526
-
tuw.author.orcid
0000-0003-2251-0004
-
tuw.event.name
2024 the 8th International Conference on System Reliability and Safety
en
tuw.event.startdate
20-11-2024
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tuw.event.enddate
22-11-2024
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tuw.event.online
Hybrid
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tuw.event.type
Event for scientific audience
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tuw.event.place
Catania
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tuw.event.country
IT
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tuw.event.presenter
Bittner, Matthias
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wb.sciencebranch
Elektrotechnik, Elektronik, Informationstechnik
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wb.sciencebranch.oefos
2020
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wb.sciencebranch.value
100
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item.openairetype
conference paper
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item.openairecristype
http://purl.org/coar/resource_type/c_5794
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item.fulltext
no Fulltext
-
item.grantfulltext
restricted
-
item.languageiso639-1
en
-
item.cerifentitytype
Publications
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crisitem.project.funder
Christian Doppler Forschungsgesells
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crisitem.project.grantno
123456
-
crisitem.author.dept
E384-02 - Forschungsbereich Systems on Chip
-
crisitem.author.dept
E384 - Institut für Computertechnik
-
crisitem.author.dept
E384-02 - Forschungsbereich Systems on Chip
-
crisitem.author.dept
E384-02 - Forschungsbereich Systems on Chip
-
crisitem.author.dept
E384-02 - Forschungsbereich Systems on Chip
-
crisitem.author.orcid
0009-0004-8022-2232
-
crisitem.author.orcid
0000-0002-1877-4114
-
crisitem.author.orcid
0009-0009-5834-6526
-
crisitem.author.orcid
0000-0003-2251-0004
-
crisitem.author.parentorg
E384 - Institut für Computertechnik
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crisitem.author.parentorg
E350 - Fakultät für Elektrotechnik und Informationstechnik