<div class="csl-bib-body">
<div class="csl-entry">Seyedfaraji, S., Bichl, M., Aftab, A., & Rehman, S. (2024). HOPE: Holistic STT-RAM Architecture Exploration Framework for Future Cross-Platform Analysis. <i>IEEE Access</i>, <i>12</i>, 16598–16609. https://doi.org/10.1109/ACCESS.2024.3358891</div>
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dc.identifier.issn
2169-3536
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/214084
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dc.description.abstract
Spin Transfer Torque Random Access Memory (STT-RAM) is an emerging Non-Volatile Memory (NVM) technology that has garnered attention to overcome the drawbacks of conventional CMOS-based technologies. However, such technologies must be evaluated before deployment under real workloads and architecture. But there is a lack of available open-source STT-RAM-based system evaluation framework, which hampers research and experimentation and impacts the adoption of STT-RAM in a system. This paper proposes a novel, extendable STT-RAM memory controller design integrated inside the gem5 simulator. Our framework enables understanding various aspects of STT-RAM, i.e., power, delay, clock cycles, energy, and system throughput. We will open-source our HOPE framework, which will fuel research and aid in accelerating the development of future system architectures based on STT-RAM. It will also facilitate the user for further tool enhancement.
en
dc.language.iso
en
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dc.publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
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dc.relation.ispartof
IEEE Access
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dc.subject
emerging technologies
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dc.subject
gem5
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dc.subject
Non-volatile memory
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dc.subject
power estimation
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dc.subject
STT-RAM
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dc.title
HOPE: Holistic STT-RAM Architecture Exploration Framework for Future Cross-Platform Analysis