<div class="csl-bib-body">
<div class="csl-entry">Krainer, R. (2025). <i>Analysis of device behaviour of single and multi finger SCRs with buried doping layers in experiment and TCAD</i> [Dissertation, Technische Universität Wien]. reposiTUm. https://doi.org/10.34726/hss.2025.130326</div>
</div>
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dc.identifier.uri
https://doi.org/10.34726/hss.2025.130326
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/215104
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dc.language
English
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dc.language.iso
en
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dc.rights.uri
http://rightsstatements.org/vocab/InC/1.0/
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dc.subject
ESD protection device
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dc.subject
ESD robustness
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dc.subject
silicon controlled rectifier (SCR)
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dc.subject
I-V hysteresis
en
dc.subject
multi finger device
en
dc.subject
TCAD simulation
en
dc.subject
emission microscopy
en
dc.subject
transient interferometric mapping
en
dc.title
Analysis of device behaviour of single and multi finger SCRs with buried doping layers in experiment and TCAD
