<div class="csl-bib-body">
<div class="csl-entry">Bahrami, M., Waldhoer, D., Khakbaz, P., Knobloch, T., Nazir, A., Liu, C., & Grasser, T. (2023). Defects in Strontium Titanate: A First Principles Study. In <i>2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)</i> (pp. 145–148). IEEE. https://doi.org/10.23919/SISPAD57422.2023.10319515</div>
</div>
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/216400
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dc.description.abstract
In recent years there has been growing interest in exploring new 2D material-based devices with improved scalability. For achieving good device performance, the need for choosing appropriate dielectrics has become evident. One promising candidate is Strontium Titanate, SrTiO3, which is a high-κ perovskite that can be transferred on 2D MoS2 and WSe2 to fabricate high-performance n- and p-type FETs. In this work we use density functional theory in conjunction with a hybrid functional to study the potential relevance of four different kinds of intrinsic defects in SrTiO3 for device performance and reliability. The defect parameters describing charge trapping are obtained using non-radiative multiphonon theory which can then be used in future TCAD and compact modeling studies. We show that based on its trap level, the titanium antisite defect is a relevant defect for MoS2/SrTiO3 based devices.
en
dc.language.iso
en
-
dc.subject
2D materials
en
dc.subject
defects
en
dc.subject
non-radiative multiphonon (NMP) theory
en
dc.subject
reliability
en
dc.subject
SrTiO 3
en
dc.title
Defects in Strontium Titanate: A First Principles Study
en
dc.type
Inproceedings
en
dc.type
Konferenzbeitrag
de
dc.contributor.affiliation
Huawei Technologies (Belgium), Belgium
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dc.contributor.affiliation
Huawei Technologies (Belgium), Belgium
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dc.relation.isbn
978-4-86348-803-8
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dc.description.startpage
145
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dc.description.endpage
148
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dc.type.category
Full-Paper Contribution
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tuw.booktitle
2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
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tuw.peerreviewed
true
-
tuw.relation.publisher
IEEE
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tuw.researchinfrastructure
Vienna Scientific Cluster
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tuw.researchTopic.id
C6
-
tuw.researchTopic.id
C1
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tuw.researchTopic.name
Modeling and Simulation
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tuw.researchTopic.name
Computational Materials Science
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tuw.researchTopic.value
50
-
tuw.researchTopic.value
50
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tuw.publication.orgunit
E360-01 - Forschungsbereich Mikroelektronik
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tuw.publication.orgunit
E056-04 - Fachbereich TU-DX: Towards Applications of 2D Materials
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tuw.publisher.doi
10.23919/SISPAD57422.2023.10319515
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dc.description.numberOfPages
4
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tuw.author.orcid
0000-0002-8631-5681
-
tuw.author.orcid
0000-0002-7794-1904
-
tuw.author.orcid
0000-0001-5156-9510
-
tuw.event.name
2023 International Conference on Simulation of Semiconductor Processes and Devices
en
tuw.event.startdate
27-09-2023
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tuw.event.enddate
29-09-2023
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tuw.event.online
On Site
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tuw.event.type
Event for scientific audience
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tuw.event.place
Kobe
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tuw.event.country
JP
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tuw.event.presenter
Bahrami, Mina
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wb.sciencebranch
Elektrotechnik, Elektronik, Informationstechnik
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wb.sciencebranch.oefos
2020
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wb.sciencebranch.value
100
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item.grantfulltext
restricted
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item.fulltext
no Fulltext
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item.cerifentitytype
Publications
-
item.languageiso639-1
en
-
item.openairetype
conference paper
-
item.openairecristype
http://purl.org/coar/resource_type/c_5794
-
crisitem.author.dept
E360-01 - Forschungsbereich Mikroelektronik
-
crisitem.author.dept
E360-01 - Forschungsbereich Mikroelektronik
-
crisitem.author.dept
E360-01 - Forschungsbereich Mikroelektronik
-
crisitem.author.dept
E360-01 - Forschungsbereich Mikroelektronik
-
crisitem.author.dept
Huawei Technologies (Belgium), Belgium
-
crisitem.author.dept
Huawei Technologies (Belgium), Belgium
-
crisitem.author.dept
E360 - Institut für Mikroelektronik
-
crisitem.author.orcid
0000-0002-8631-5681
-
crisitem.author.orcid
0000-0002-7794-1904
-
crisitem.author.orcid
0000-0001-5156-9510
-
crisitem.author.parentorg
E360 - Institut für Mikroelektronik
-
crisitem.author.parentorg
E360 - Institut für Mikroelektronik
-
crisitem.author.parentorg
E360 - Institut für Mikroelektronik
-
crisitem.author.parentorg
E360 - Institut für Mikroelektronik
-
crisitem.author.parentorg
E350 - Fakultät für Elektrotechnik und Informationstechnik