<div class="csl-bib-body">
<div class="csl-entry">Müller-Gritschneder, D. (2025, May 30). <i>Low Overhead Fault Tolerance for tinyML and Security Applications</i> [Presentation]. 3rd Workshop on Intelligent Methods for Test and Reliability, Tallinn, Estonia. http://hdl.handle.net/20.500.12708/219806</div>
</div>
-
dc.identifier.uri
http://hdl.handle.net/20.500.12708/219806
-
dc.description.abstract
Random HW faults as well as targeted fault attacks jeopardize the safety and security of digital
systems respectively. The standard protection approach relies on the insertion of spatial HW or
temporal SW redundancy to detect errors before they propagate to critical parts of the system and
create safety or security hazards. Redundancy comes at high costs, usually more than 2X for dualmodular and more than 3X for triple modular redundancy. To reduce these costs, selective hardening
or specialized protection scheme such as algorithmic based fault tolerance (ABFT) can be applied. In
this talk, we cover several systematic approaches to apply selective hardening and ABFT for tinyML
and security applications. In order to evaluate these schemes a fast open source fault injection
environment based on Verilator is presented.
en
dc.language.iso
en
-
dc.subject
tinyML
en
dc.subject
Fault Tolerance
en
dc.subject
HW Security
en
dc.subject
Embedded Machine Learning
en
dc.title
Low Overhead Fault Tolerance for tinyML and Security Applications
en
dc.type
Presentation
en
dc.type
Vortrag
de
dc.type.category
Presentation
-
tuw.publication.invited
invited
-
tuw.researchTopic.id
I2
-
tuw.researchTopic.name
Computer Engineering and Software-Intensive Systems
-
tuw.researchTopic.value
100
-
tuw.publication.orgunit
E191-02 - Forschungsbereich Embedded Computing Systems
-
tuw.author.orcid
0000-0003-0903-631X
-
tuw.event.name
3rd Workshop on Intelligent Methods for Test and Reliability
en
tuw.event.startdate
29-05-2025
-
tuw.event.enddate
30-05-2025
-
tuw.event.online
On Site
-
tuw.event.type
Event for scientific audience
-
tuw.event.place
Tallinn
-
tuw.event.country
EE
-
tuw.event.presenter
Müller-Gritschneder, Daniel
-
tuw.event.track
Single Track
-
wb.sciencebranch
Informatik
-
wb.sciencebranch
Elektrotechnik, Elektronik, Informationstechnik
-
wb.sciencebranch
Mathematik
-
wb.sciencebranch.oefos
1020
-
wb.sciencebranch.oefos
2020
-
wb.sciencebranch.oefos
1010
-
wb.sciencebranch.value
50
-
wb.sciencebranch.value
40
-
wb.sciencebranch.value
10
-
item.languageiso639-1
en
-
item.grantfulltext
none
-
item.openairetype
conference presentation
-
item.openairecristype
http://purl.org/coar/resource_type/R60J-J5BD
-
item.cerifentitytype
Publications
-
item.fulltext
no Fulltext
-
crisitem.author.dept
E191-02 - Forschungsbereich Embedded Computing Systems