<div class="csl-bib-body">
<div class="csl-entry">Lewitschnig, H. J., Mayrhofer, M., & Filzmoser, P. (2025). A New View to Mission Profiles. In <i>2025 Annual Reliability and Maintainability Symposium (RAMS)</i>. 2025 Annual Reliability and Maintainability Symposium (RAMS), Destin, FL, United States of America (the). IEEE. https://doi.org/10.1109/RAMS48127.2025.10935003</div>
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/220195
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dc.description.abstract
Mission profiles cover the conditions that a component, e.g., an electronic component of a vehicle, is exposed to during its lifecycle. Currently, these profiles typically provide descriptive summaries, such as histograms, of single stress parameters like temperature, humidity, or voltage. This is highly aggregated information. New requirements for electric and autonomous driving cars require much more information how applications are used. In this work, we present a new approach for mission profiles which contains detailed usage information. We suggest a functional description over time, which allows joint modeling of various characteristics such as temperature, humidity, and voltage. The entire lifecycle history is covered, and the method can control the temporal resolution, i.e., the level of details of a mission profile. As a result, more accurate mission profiles can be generated, user quantiles can be derived, and usage outliers can be identified. This model establishes a framework to exchange usage data between suppliers, original equipment manufacturers (OEMs), and end customers while data integrity and protection are assured.
en
dc.language.iso
en
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dc.subject
Functional Data Analysis
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dc.subject
Mission Profile
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dc.subject
Usage Profile
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dc.title
A New View to Mission Profiles
en
dc.type
Inproceedings
en
dc.type
Konferenzbeitrag
de
dc.contributor.affiliation
Infineon Technologies (Austria), Austria
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dc.relation.isbn
979-8-3503-6774-4
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dc.relation.doi
10.1109/RAMS48127.2025
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dc.relation.issn
0149-144X
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dc.type.category
Full-Paper Contribution
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dc.relation.eissn
2577-0993
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tuw.booktitle
2025 Annual Reliability and Maintainability Symposium (RAMS)