DC Field
Value
Language
dc.contributor.author
Sauer, Markus
-
dc.contributor.author
Rath, Jakob
-
dc.contributor.author
Foelske, Annette
-
dc.contributor.author
Ingerle, Dieter
-
dc.date.accessioned
2025-11-18T09:23:55Z
-
dc.date.available
2025-11-18T09:23:55Z
-
dc.date.issued
2025-09
-
dc.identifier.citation
<div class="csl-bib-body"> <div class="csl-entry">Sauer, M., Rath, J., Foelske, A., &#38; Ingerle, D. (2025). Thickness and Elemental Quantification of (Ultra)Thin Films Revisited. In <i>AVS Quantum Science Workshop : Abstract Book</i> (pp. 178–178).</div> </div>
-
dc.identifier.uri
http://hdl.handle.net/20.500.12708/221186
-
dc.description
https://avs71.avs.org/
-
dc.description.sponsorship
FFG - Österr. Forschungsförderungs- gesellschaft mbH
-
dc.language.iso
en
-
dc.subject
Thin films
en
dc.subject
Thickness determination
en
dc.subject
Surface analytics
en
dc.title
Thickness and Elemental Quantification of (Ultra)Thin Films Revisited
en
dc.type
Inproceedings
en
dc.type
Konferenzbeitrag
de
dc.description.startpage
178
-
dc.description.endpage
178
-
dc.relation.grantno
884672
-
dc.type.category
Abstract Book Contribution
-
tuw.booktitle
AVS Quantum Science Workshop : Abstract Book
-
tuw.project.title
Elektrochemischer Oberflächen- und Grenzflächen- Analytik Cluster
-
tuw.researchinfrastructure
Analytical Instrumentation Center
-
tuw.researchinfrastructure
Röntgenzentrum
-
tuw.researchTopic.id
M2
-
tuw.researchTopic.id
M1
-
tuw.researchTopic.name
Materials Characterization
-
tuw.researchTopic.name
Surfaces and Interfaces
-
tuw.researchTopic.value
50
-
tuw.researchTopic.value
50
-
tuw.publication.orgunit
E057-05 - Fachbereich Analytical Instrumentation Center
-
tuw.publication.orgunit
E057-04 - Fachbereich Röntgenzentrum
-
tuw.publication.orgunit
E141-05 - Forschungsbereich Radiation Physics
-
tuw.publication.orgunit
E056-04 - Fachbereich TU-DX: Towards Applications of 2D Materials
-
dc.description.numberOfPages
1
-
tuw.author.orcid
0000-0003-1720-6032
-
tuw.author.orcid
0000-0002-7022-6668
-
tuw.author.orcid
0000-0001-7256-6511
-
tuw.author.orcid
0000-0003-2686-7641
-
tuw.event.name
AVS 71 International Symposium and Exhibition 2025
en
tuw.event.startdate
22-09-2025
-
tuw.event.enddate
25-09-2025
-
tuw.event.online
On Site
-
tuw.event.type
Event for scientific audience
-
tuw.event.place
Charlotte
-
tuw.event.country
US
-
tuw.event.institution
AVS
-
tuw.event.presenter
Sauer, Markus
-
wb.sciencebranch
Chemie
-
wb.sciencebranch
Physik, Astronomie
-
wb.sciencebranch.oefos
1040
-
wb.sciencebranch.oefos
1030
-
wb.sciencebranch.value
60
-
wb.sciencebranch.value
40
-
item.openairetype
conference paper
-
item.openairecristype
http://purl.org/coar/resource_type/c_5794
-
item.cerifentitytype
Publications
-
item.languageiso639-1
en
-
item.grantfulltext
none
-
item.fulltext
no Fulltext
-
crisitem.author.dept
E057-05 - Fachbereich Analytical Instrumentation Center
-
crisitem.author.dept
E057-05 - Fachbereich Analytical Instrumentation Center
-
crisitem.author.dept
E057-05 - Fachbereich Analytical Instrumentation Center
-
crisitem.author.dept
E057-04 - Fachbereich Röntgenzentrum
-
crisitem.author.orcid
0000-0003-1720-6032
-
crisitem.author.orcid
0000-0002-7022-6668
-
crisitem.author.orcid
0000-0001-7256-6511
-
crisitem.author.orcid
0000-0003-2686-7641
-
crisitem.author.parentorg
E057 - Facilities und Zentren
-
crisitem.author.parentorg
E057 - Facilities und Zentren
-
crisitem.author.parentorg
E057 - Facilities und Zentren
-
crisitem.author.parentorg
E057 - Facilities und Zentren
-
crisitem.project.funder
FFG - Österr. Forschungsförderungs- gesellschaft mbH
-
crisitem.project.grantno
884672
-
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