<div class="csl-bib-body">
<div class="csl-entry">Wobrauschek, P., Ingerle, D., Ziegler, P., Krstajic, D., Müller, M., & Streli, C. (2025). Characterization of the ATI TXRF Spectrometer from the Detection of low Z Elements. In <i>20th International Conference on Total Reflection X-ray Fluorescence Analysis and Related Methods : September 9-12, 2025, Jan Kochanowski University, Kielce, Poland : Program and book of abstracts</i> (pp. 60–60). http://hdl.handle.net/20.500.12708/221188</div>
</div>
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/221188
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dc.language.iso
en
-
dc.subject
TXRF vacuum chamber
en
dc.title
Characterization of the ATI TXRF Spectrometer from the Detection of low Z Elements
en
dc.type
Inproceedings
en
dc.type
Konferenzbeitrag
de
dc.contributor.affiliation
TU Wien, Austria
-
dc.contributor.affiliation
TU Wien, Austria
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dc.description.startpage
60
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dc.description.endpage
60
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dc.type.category
Abstract Book Contribution
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tuw.booktitle
20th International Conference on Total Reflection X-ray Fluorescence Analysis and Related Methods : September 9-12, 2025, Jan Kochanowski University, Kielce, Poland : Program and book of abstracts
-
tuw.researchTopic.id
C1
-
tuw.researchTopic.name
Computational Materials Science
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tuw.researchTopic.value
100
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tuw.publication.orgunit
E141-05 - Forschungsbereich Radiation Physics
-
tuw.publication.orgunit
E057-04 - Fachbereich Röntgenzentrum
-
dc.description.numberOfPages
1
-
tuw.author.orcid
0000-0002-3699-3003
-
tuw.author.orcid
0000-0003-2686-7641
-
tuw.author.orcid
0000-0002-1698-0918
-
tuw.author.orcid
0000-0002-5141-3177
-
tuw.event.name
20th International Conference on Total Reflection X-ray Fluorescence Analysis and Related Methods (TXRF 2025)
