<div class="csl-bib-body">
<div class="csl-entry">Huemer, F., Najvirt, R., & Steininger, A. (2022). On SAT-Based Model Checking of Speed-Independent Circuits. In H. Kubatova (Ed.), <i>2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)</i> (pp. 100–105). Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/DDECS54261.2022.9770165</div>
</div>
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/221431
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dc.description.abstract
Formal verification plays an important role in the quality assurance of digital circuits. Apart from the now standard equivalence checking between design steps, functional correctness can be proven with model checking. In one approach, a Boolean satisfiability (SAT) problem describing the circuit's implementation and expected properties is generated for each of a bounded number of time steps and fed to a SAT solver. In synchronous circuits, the time steps correspond to cycles of the global clock. The execution of asynchronous, specifically speed-independent (SI) circuits, however, relies on local handshakes instead of a global time reference. This absence of a global clock requires a different approach for choosing time steps for the SAT problem.This paper presents how bounded, SAT-based model checking can be used on SI asynchronous circuits. We aim to give a general and accessible introduction to this topic, highlight the inherent computational complexity and show that setting up a basic model checker for SI circuits is possible with quite simple means, without any reliance on (expensive) commercial tools. For our reference implementation used in the provided examples we use the open source Z3 solver.
en
dc.description.sponsorship
FWF Fonds zur Förderung der wissenschaftlichen Forschung (FWF)
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dc.language.iso
en
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dc.relation.ispartofseries
IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems
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dc.subject
asynchronous
en
dc.subject
bounded model checking
en
dc.subject
SAT
en
dc.subject
speed-independent
en
dc.title
On SAT-Based Model Checking of Speed-Independent Circuits
en
dc.type
Inproceedings
en
dc.type
Konferenzbeitrag
de
dc.relation.isbn
9781665494311
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dc.description.startpage
100
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dc.description.endpage
105
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dc.relation.grantno
I 3485-N31
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dc.type.category
Full-Paper Contribution
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dc.relation.eissn
2473-2117
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tuw.booktitle
2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
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tuw.peerreviewed
true
-
tuw.book.ispartofseries
IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems
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tuw.relation.publisher
Institute of Electrical and Electronics Engineers (IEEE)
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tuw.relation.publisherplace
Piscataway
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tuw.project.title
Sicherstellen der Robustheit in stromsparenden asynchronen Schaltungen
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tuw.researchTopic.id
I2
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tuw.researchTopic.name
Computer Engineering and Software-Intensive Systems
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tuw.researchTopic.value
100
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tuw.publication.orgunit
E191-02 - Forschungsbereich Embedded Computing Systems
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tuw.publisher.doi
10.1109/DDECS54261.2022.9770165
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dc.description.numberOfPages
6
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tuw.author.orcid
0000-0002-2776-7768
-
tuw.author.orcid
0000-0002-3847-1647
-
tuw.editor.orcid
0000-0002-5011-6891
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tuw.event.name
25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems
en
tuw.event.startdate
06-04-2022
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tuw.event.enddate
08-04-2022
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tuw.event.online
Hybrid
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tuw.event.type
Event for scientific audience
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tuw.event.place
Prag
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tuw.event.country
CZ
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tuw.event.presenter
Najvirt, Robert
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wb.sciencebranch
Informatik
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wb.sciencebranch
Elektrotechnik, Elektronik, Informationstechnik
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wb.sciencebranch.oefos
1020
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wb.sciencebranch.oefos
2020
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wb.sciencebranch.value
60
-
wb.sciencebranch.value
40
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item.openairecristype
http://purl.org/coar/resource_type/c_5794
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item.cerifentitytype
Publications
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item.openairetype
conference paper
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item.fulltext
no Fulltext
-
item.languageiso639-1
en
-
item.grantfulltext
restricted
-
crisitem.author.dept
E191-02 - Forschungsbereich Embedded Computing Systems
-
crisitem.author.dept
E191-02 - Forschungsbereich Embedded Computing Systems
-
crisitem.author.dept
E191-02 - Forschungsbereich Embedded Computing Systems