<div class="csl-bib-body">
<div class="csl-entry">Fahrnberger, F., Siebenhofer, M., Hahn, M., Sauer, M., Foelske, A., Friedbacher, G., Kubicek, M., & Hutter, H. (2024). Investigation of sub-nm binary oxidic surface modifications on mixed ionic electronic conductors with ToF-SIMS: Oxidic overlayer stability and ionic interdiffusion behavior. In <i>SIMS24 : Abstract Book</i> (pp. 179–179).</div>
</div>
-
dc.identifier.uri
http://hdl.handle.net/20.500.12708/223231
-
dc.language.iso
en
-
dc.subject
ToF-SIMS
en
dc.subject
Mixed ionic electronic oxides
en
dc.subject
Oxidic decorations
en
dc.subject
Secondary ion formation
en
dc.subject
Surface-near dipoles
en
dc.title
Investigation of sub-nm binary oxidic surface modifications on mixed ionic electronic conductors with ToF-SIMS: Oxidic overlayer stability and ionic interdiffusion behavior
en
dc.type
Inproceedings
en
dc.type
Konferenzbeitrag
de
dc.contributor.affiliation
Massachusetts Institute of Technology, United States of America (the)
-
dc.description.startpage
179
-
dc.description.endpage
179
-
dc.type.category
Abstract Book Contribution
-
tuw.booktitle
SIMS24 : Abstract Book
-
tuw.researchinfrastructure
Analytical Instrumentation Center
-
tuw.researchinfrastructure
Röntgenzentrum
-
tuw.researchTopic.id
M2
-
tuw.researchTopic.id
M1
-
tuw.researchTopic.name
Materials Characterization
-
tuw.researchTopic.name
Surfaces and Interfaces
-
tuw.researchTopic.value
50
-
tuw.researchTopic.value
50
-
tuw.publication.orgunit
E057-05 - Fachbereich Analytical Instrumentation Center
-
tuw.publication.orgunit
E057-04 - Fachbereich Röntgenzentrum
-
tuw.publication.orgunit
E164-01-2 - Forschungsgruppe Oberflächen-, Spurenanalytik und Chemometrie
-
tuw.publication.orgunit
E164-04-3 - Forschungsgruppe Festkörperionik
-
tuw.publication.orgunit
E056-04 - Fachbereich TU-DX: Towards Applications of 2D Materials
-
dc.description.numberOfPages
1
-
tuw.author.orcid
0009-0006-7060-6691
-
tuw.author.orcid
0000-0002-6450-0261
-
tuw.author.orcid
0000-0003-1720-6032
-
tuw.author.orcid
0000-0001-7256-6511
-
tuw.author.orcid
0000-0001-6623-9805
-
tuw.event.name
24th International Conference on Secondary Ion Mass Spectrometry (SIMS-24)
en
tuw.event.startdate
08-09-2024
-
tuw.event.enddate
13-09-2024
-
tuw.event.online
On Site
-
tuw.event.type
Event for scientific audience
-
tuw.event.place
La Rochelle
-
tuw.event.country
FR
-
tuw.event.institution
Société Française du Vide (SFV)
-
tuw.event.presenter
Fahrnberger, Florian
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wb.sciencebranch
Chemie
-
wb.sciencebranch.oefos
1040
-
wb.sciencebranch.value
100
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item.openairetype
conference paper
-
item.openairecristype
http://purl.org/coar/resource_type/c_5794
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item.cerifentitytype
Publications
-
item.languageiso639-1
en
-
item.grantfulltext
none
-
item.fulltext
no Fulltext
-
crisitem.author.dept
E057-05 - Fachbereich Analytical Instrumentation Center
-
crisitem.author.dept
E164-04-3 - Forschungsgruppe Festkörperionik
-
crisitem.author.dept
E164-01-2 - Forschungsgruppe Oberflächen-, Spurenanalytik und Chemometrie
-
crisitem.author.dept
E057-05 - Fachbereich Analytical Instrumentation Center
-
crisitem.author.dept
E057-05 - Fachbereich Analytical Instrumentation Center
-
crisitem.author.dept
E164-01-2 - Forschungsgruppe Oberflächen-, Spurenanalytik und Chemometrie
-
crisitem.author.dept
E164-04-3 - Forschungsgruppe Festkörperionik
-
crisitem.author.dept
E164-01-2 - Forschungsgruppe Oberflächen-, Spurenanalytik und Chemometrie
