<div class="csl-bib-body">
<div class="csl-entry">Franceschi, G., Riva, M., Schmid, M., & Diebold, U. (2025). Scanning Probe Microscopy. In S. A. Chambers (Ed.), <i>Handbook of Molecular Beam Epitaxy of Oxide Materials : Volume 2: Materials Characterization Methods for Epitaxial Films and Heterostructures</i> (pp. 443–537). World Scientific Publishing. https://doi.org/10.1142/9789819805631_0007</div>
</div>
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/223326
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dc.description.abstract
This chapter discusses the applicability of STM within highly controlled thin-film studies. We chose to focus on STM because it is much more widely spread as compared to other techniques that can provide direct atomic-scale information on growth processes and because this technique fits our own expertise. The chapter is intended for non-STM experts.
en
dc.language.iso
en
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dc.subject
Surface Physics
en
dc.title
Scanning Probe Microscopy
en
dc.type
Book Contribution
en
dc.type
Buchbeitrag
de
dc.relation.doi
10.1142/14109-vol2
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dc.description.startpage
443
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dc.description.endpage
537
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dc.type.category
Edited Volume Contribution
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tuw.booktitle
Handbook of Molecular Beam Epitaxy of Oxide Materials : Volume 2: Materials Characterization Methods for Epitaxial Films and Heterostructures
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tuw.relation.publisher
World Scientific Publishing
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tuw.researchTopic.id
M1
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tuw.researchTopic.name
Surfaces and Interfaces
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tuw.researchTopic.value
100
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tuw.publication.orgunit
E134-05 - Forschungsbereich Surface Physics
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tuw.publication.orgunit
E056-04 - Fachbereich TU-DX: Towards Applications of 2D Materials
