<div class="csl-bib-body">
<div class="csl-entry">El Shahaby, R., Függer, M., Huemer, F., & Steininger, A. (2025). SeAL: A Provably Complete Fault-Injection Tool for Asynchronous Circuits. In <i>2025 32nd IEEE International Conference on Electronics, Circuits and Systems (ICECS)</i>. 32nd IEEE International Conference on Electronics, Circuits and Systems (ICECS 2025), Marrakech, Morocco. IEEE. https://doi.org/10.1109/ICECS66544.2025.11270590</div>
</div>
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/223666
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dc.description.abstract
As fault tolerance becomes an increasingly critical concern in digital circuit design, asynchronous architectures offer promising robustness against faults like timing variations. Although prior studies have investigated circuit fault behavior using empirical techniques, a comprehensive analysis grounded in formal methods has remained largely unexplored.In this paper, we present the tool SeAL (Sensitivity Ana-lyzer for Asynchronous Logic) that enables formal modeling, simulation, and systematic fault injection for both transient and permanent fault types. Leveraging provably complete algorithms, our tool reliably identifies susceptibility windows for all signals in a circuit, i.e., critical temporal regions where circuit behavior may deviate due to injected faults. It supports trace-based simulation, fault equivalence checking, and output analysis to reveal vulnerabilities that are difficult to detect through traditional testing. The tool’s modular architecture allows seamless integration with circuit descriptions and supports both empirical experimentation and formal verification workflows. We demonstrate its capabilities through case studies on quasi delay-insensitive (QDI) components, highlighting its value in rigorous fault resilience evaluation, and show that the tool can also be used to analyze synchronous circuits, allowing one to systematically compare design paradigms with respect to resilience.
en
dc.language.iso
en
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dc.subject
fault tolerance
en
dc.subject
transient faults
en
dc.subject
permanent faults
en
dc.subject
asynchronous circuits
en
dc.subject
synchronous circuits
en
dc.subject
automatic evaluation
en
dc.title
SeAL: A Provably Complete Fault-Injection Tool for Asynchronous Circuits
en
dc.type
Inproceedings
en
dc.type
Konferenzbeitrag
de
dc.contributor.affiliation
Université Paris-Saclay, France
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dc.relation.isbn
979-8-3315-9585-2
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dc.relation.doi
10.1109/ICECS66544.2025
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dc.type.category
Full-Paper Contribution
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tuw.booktitle
2025 32nd IEEE International Conference on Electronics, Circuits and Systems (ICECS)
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tuw.peerreviewed
true
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tuw.relation.publisher
IEEE
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tuw.researchTopic.id
I2
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tuw.researchTopic.name
Computer Engineering and Software-Intensive Systems
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tuw.researchTopic.value
100
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tuw.publication.orgunit
E191-02 - Forschungsbereich Embedded Computing Systems
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tuw.publication.orgunit
E056-17 - Fachbereich Trustworthy Autonomous Cyber-Physical Systems
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tuw.publisher.doi
10.1109/ICECS66544.2025.11270590
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dc.description.numberOfPages
6
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tuw.author.orcid
0000-0001-5765-0301
-
tuw.author.orcid
0000-0002-2776-7768
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tuw.author.orcid
0000-0002-3847-1647
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tuw.event.name
32nd IEEE International Conference on Electronics, Circuits and Systems (ICECS 2025)
en
tuw.event.startdate
17-11-2025
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tuw.event.enddate
19-11-2025
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tuw.event.online
On Site
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tuw.event.type
Event for scientific audience
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tuw.event.place
Marrakech
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tuw.event.country
MA
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tuw.event.presenter
El Shahaby, Raghda
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wb.sciencebranch
Informatik
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wb.sciencebranch
Elektrotechnik, Elektronik, Informationstechnik
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wb.sciencebranch
Mathematik
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wb.sciencebranch.oefos
1020
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wb.sciencebranch.oefos
2020
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wb.sciencebranch.oefos
1010
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wb.sciencebranch.value
50
-
wb.sciencebranch.value
40
-
wb.sciencebranch.value
10
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item.openairetype
conference paper
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item.openairecristype
http://purl.org/coar/resource_type/c_5794
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item.cerifentitytype
Publications
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item.languageiso639-1
en
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item.grantfulltext
none
-
item.fulltext
no Fulltext
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crisitem.author.dept
E191-02 - Forschungsbereich Embedded Computing Systems
-
crisitem.author.dept
Université Paris-Saclay, France
-
crisitem.author.dept
E191-02 - Forschungsbereich Embedded Computing Systems
-
crisitem.author.dept
E191-02 - Forschungsbereich Embedded Computing Systems