<div class="csl-bib-body">
<div class="csl-entry">Waldhör, D., Turiansky, M., Lee, woncheol, Van De Walle, C. G., & Grasser, T. (2025, August). <i>First-Principles Analysis of Hole-Induced Si-H Bond Dissociation in Silicon Dioxide</i> [Poster Presentation]. PSI-K 2025, Lausanne, Switzerland. http://hdl.handle.net/20.500.12708/224251</div>
</div>
-
dc.identifier.uri
http://hdl.handle.net/20.500.12708/224251
-
dc.description.sponsorship
European Commission
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dc.language.iso
en
-
dc.subject
silicon dioxide
en
dc.subject
reliability
en
dc.subject
density functional theory
en
dc.title
First-Principles Analysis of Hole-Induced Si-H Bond Dissociation in Silicon Dioxide
en
dc.type
Presentation
en
dc.type
Vortrag
de
dc.contributor.affiliation
University of California, Santa Barbara, United States of America (the)
-
dc.relation.grantno
101021351
-
dc.type.category
Poster Presentation
-
tuw.project.title
Fluoride für die nächste Generation von 2D Nanoelektronik
-
tuw.researchinfrastructure
Vienna Scientific Cluster
-
tuw.researchTopic.id
Q4
-
tuw.researchTopic.id
C6
-
tuw.researchTopic.name
Nanoelectronics
-
tuw.researchTopic.name
Modeling and Simulation
-
tuw.researchTopic.value
25
-
tuw.researchTopic.value
75
-
tuw.publication.orgunit
E360-01 - Forschungsbereich Mikroelektronik
-
tuw.publication.orgunit
E056-04 - Fachbereich TU-DX: Towards Applications of 2D Materials
-
tuw.author.orcid
0000-0002-8631-5681
-
tuw.author.orcid
0009-0007-4183-8933
-
tuw.author.orcid
0000-0002-4212-5990
-
tuw.event.name
PSI-K 2025
en
tuw.event.startdate
25-08-2025
-
tuw.event.enddate
28-08-2025
-
tuw.event.online
On Site
-
tuw.event.type
Event for scientific audience
-
tuw.event.place
Lausanne
-
tuw.event.country
CH
-
tuw.event.presenter
Waldhör, Dominic
-
wb.sciencebranch
Elektrotechnik, Elektronik, Informationstechnik
-
wb.sciencebranch.oefos
2020
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wb.sciencebranch.value
100
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item.openairetype
conference poster not in proceedings
-
item.openairecristype
http://purl.org/coar/resource_type/c_18co
-
item.cerifentitytype
Publications
-
item.languageiso639-1
en
-
item.grantfulltext
none
-
item.fulltext
no Fulltext
-
crisitem.author.dept
E360-01 - Forschungsbereich Mikroelektronik
-
crisitem.author.dept
University of California, Santa Barbara, United States of America (the)
-
crisitem.author.dept
E360 - Institut für Mikroelektronik
-
crisitem.author.orcid
0000-0002-8631-5681
-
crisitem.author.orcid
0009-0007-4183-8933
-
crisitem.author.orcid
0000-0002-4212-5990
-
crisitem.author.parentorg
E360 - Institut für Mikroelektronik
-
crisitem.author.parentorg
E350 - Fakultät für Elektrotechnik und Informationstechnik