<div class="csl-bib-body">
<div class="csl-entry">Waldhör, D., Feil, M., & Grasser, T. (2025, September). <i>Optical spectroscopy of interfacial point defects via electrically stimulated recombination in fully processed silicon carbide power MOSFETs</i> [Conference Presentation]. International Conference on Defects in Semiconductors (ICDS 2025), Shanghai, China. http://hdl.handle.net/20.500.12708/224261</div>
</div>
-
dc.identifier.uri
http://hdl.handle.net/20.500.12708/224261
-
dc.description.sponsorship
European Commission
-
dc.language.iso
en
-
dc.subject
silicon carbide
en
dc.subject
spectroscopy
en
dc.subject
interface defects
en
dc.title
Optical spectroscopy of interfacial point defects via electrically stimulated recombination in fully processed silicon carbide power MOSFETs
en
dc.type
Presentation
en
dc.type
Vortrag
de
dc.relation.grantno
101021351
-
dc.type.category
Conference Presentation
-
tuw.publication.invited
invited
-
tuw.project.title
Fluoride für die nächste Generation von 2D Nanoelektronik
-
tuw.researchTopic.id
M1
-
tuw.researchTopic.id
C6
-
tuw.researchTopic.name
Surfaces and Interfaces
-
tuw.researchTopic.name
Modeling and Simulation
-
tuw.researchTopic.value
80
-
tuw.researchTopic.value
20
-
tuw.publication.orgunit
E360-01 - Forschungsbereich Mikroelektronik
-
tuw.author.orcid
0000-0002-8631-5681
-
tuw.event.name
International Conference on Defects in Semiconductors (ICDS 2025)
en
tuw.event.startdate
14-09-2025
-
tuw.event.enddate
19-09-2025
-
tuw.event.online
On Site
-
tuw.event.type
Event for scientific audience
-
tuw.event.place
Shanghai
-
tuw.event.country
CN
-
tuw.event.presenter
Waldhör, Dominic
-
wb.sciencebranch
Elektrotechnik, Elektronik, Informationstechnik
-
wb.sciencebranch.oefos
2020
-
wb.sciencebranch.value
100
-
item.openairetype
conference paper not in proceedings
-
item.openairecristype
http://purl.org/coar/resource_type/c_18cp
-
item.cerifentitytype
Publications
-
item.languageiso639-1
en
-
item.grantfulltext
none
-
item.fulltext
no Fulltext
-
crisitem.author.dept
E360-01 - Forschungsbereich Mikroelektronik
-
crisitem.author.dept
E360 - Institut für Mikroelektronik
-
crisitem.author.orcid
0000-0002-8631-5681
-
crisitem.author.parentorg
E360 - Institut für Mikroelektronik
-
crisitem.author.parentorg
E350 - Fakultät für Elektrotechnik und Informationstechnik