<div class="csl-bib-body">
<div class="csl-entry">Bammer, F. (2024). Ellipsometric Measurements on Oil-layers on Technical Surfaces. In K. Hingerl (Ed.), <i>OSI 14 : The 14th International Conference on Optics of Surfaces and Interfaces</i> (pp. 10–10).</div>
</div>
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/225478
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dc.description
Conference contribution
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dc.description.abstract
We examine the usefulness of IR-ellipsometry for the measurement of the thickness of oil layers on metals, or more generally, of dielectric layers on metallic substrates. IR-ellipsometry may offer in inline applications like rolling or deep-drawing more robustness than the currently
used methods, based on IR-spectroscopy or fluorescence, which are too dependent on the type of substrate and/or the type of oil.
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dc.description.sponsorship
EMG Automation GmbH
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dc.language.iso
en
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dc.subject
Ellipsometry
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dc.subject
infrared ellipsometry
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dc.subject
quality assurance
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dc.subject
Inline Metrology
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dc.subject
layer
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dc.title
Ellipsometric Measurements on Oil-layers on Technical Surfaces
en
dc.type
Inproceedings
en
dc.type
Konferenzbeitrag
de
dc.contributor.editoraffiliation
Johannes Kepler University of Linz, Austria
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dc.description.startpage
10
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dc.description.endpage
10
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dc.relation.grantno
1
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dc.type.category
Abstract Book Contribution
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tuw.booktitle
OSI 14 : The 14th International Conference on Optics of Surfaces and Interfaces
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tuw.project.title
Bildgebende Echtzeit-Infrarot-Ellipsometrie
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tuw.researchTopic.id
Q1
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tuw.researchTopic.id
E6
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tuw.researchTopic.name
Photonics
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tuw.researchTopic.name
Sustainable Production and Technologies
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tuw.researchTopic.value
30
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tuw.researchTopic.value
70
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tuw.publication.orgunit
E311-02-2 - Forschungsgruppe Prozesstechnik
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dc.description.numberOfPages
1
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tuw.event.name
The 14th International Conference on Optics of Surfaces and Interfaces
