<div class="csl-bib-body">
<div class="csl-entry">Zarepakzad, S., Thorat, S., Egger, P., Schmid, U., & Schneider, M. (2025). Machine Learning-Driven High-Throughput Analysis of Damping Effects in Silicon-Based Cantilever Resonators with Metallic Coating. In <i>COST Action MecaNano General Meeting 2025 - Book of Abtracts</i> (pp. 110–110).</div>
</div>
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/226173
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dc.description.abstract
Micromechanical and nanomechanical resonators serve as essential components in a wide range of applications, including resonant sensing and energy harvesting. Resonance testing plays a fundamental role in characterizing the dynamic behavior of MEMS devices, providing insights into critical properties such as energy dissipation and structural integrity. Automated high-throughput resonance testing of silicon-based cantilever resonators with various metallic coatings offers valuable insights into the damping effects on resonance frequency and quality factor. A comprehensive study is conducted on a full wafer containing 580 devices, each hosting four cantilevers with varying dimensions, to evaluate damping mechanisms. These cantilevers are analyzed in both uncoated (reference) state and with metallic coatings of varying coverage percentages and materials, including aluminium, platinum, and molybdenum. Machine learning (ML) serves as an effective tool for interpreting complex patterns in large datasets, facilitating the identification of trends and dominant damping mechanisms that are otherwise difficult to discern. A ML framework is applied to analyze the extensive dataset, incorporating features such as cantilever dimensions, die location on the wafer, and coating parameters. Predictive models are developed to estimate changes in resonance frequency and quality factor while isolating the dominant damping mechanisms. Particular attention is given to the contributions of thermoelastic damping and surface effects, which have a significant impact on the dynamic performance of silicon cantilevers. This research highlights the importance of integrating automated high-throughput testing with ML to enhance the understanding of damping mechanisms in MEMS resonators. The results provide a foundation for the design of high-performance cantilever resonators tailored to specific applications, particularly those requiring the minimization of damping losses.
en
dc.language.iso
en
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dc.subject
Machine Learning-Driven
en
dc.subject
Cantilever
en
dc.subject
Silicon-Based
en
dc.subject
Resonators
en
dc.subject
Metallic Coating
en
dc.title
Machine Learning-Driven High-Throughput Analysis of Damping Effects in Silicon-Based Cantilever Resonators with Metallic Coating
en
dc.type
Inproceedings
en
dc.type
Konferenzbeitrag
de
dc.contributor.affiliation
TU Wien, Austria
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dc.description.startpage
110
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dc.description.endpage
110
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dc.type.category
Abstract Book Contribution
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tuw.booktitle
COST Action MecaNano General Meeting 2025 - Book of Abtracts
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tuw.researchTopic.id
I8
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tuw.researchTopic.name
Sensor Systems
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tuw.researchTopic.value
100
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tuw.publication.orgunit
E366-02 - Forschungsbereich Mikrosystemtechnik
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dc.description.numberOfPages
1
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tuw.author.orcid
0000-0002-7029-4812
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tuw.author.orcid
0000-0001-9846-7132
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tuw.event.name
COST Action MecaNano General Meeting 2025
en
tuw.event.startdate
19-05-2025
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tuw.event.enddate
21-05-2025
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tuw.event.online
On Site
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tuw.event.type
Event for scientific audience
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tuw.event.place
Krakow
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tuw.event.country
PL
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tuw.event.presenter
Zarepakzad, Sina
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tuw.event.track
Single Track
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wb.sciencebranch
Elektrotechnik, Elektronik, Informationstechnik
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wb.sciencebranch.oefos
2020
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wb.sciencebranch.value
100
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item.openairecristype
http://purl.org/coar/resource_type/c_5794
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item.fulltext
no Fulltext
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item.languageiso639-1
en
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item.grantfulltext
restricted
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item.openairetype
conference paper
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item.cerifentitytype
Publications
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crisitem.author.dept
E366-02 - Forschungsbereich Mikrosystemtechnik
-
crisitem.author.dept
E366-02 - Forschungsbereich Mikrosystemtechnik
-
crisitem.author.dept
TU Wien, Austria
-
crisitem.author.dept
E366 - Institut für Sensor- und Aktuatorsysteme
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crisitem.author.dept
E366-02 - Forschungsbereich Mikrosystemtechnik
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crisitem.author.orcid
0000-0002-7029-4812
-
crisitem.author.orcid
0000-0001-9846-7132
-
crisitem.author.parentorg
E366 - Institut für Sensor- und Aktuatorsysteme
-
crisitem.author.parentorg
E366 - Institut für Sensor- und Aktuatorsysteme
-
crisitem.author.parentorg
E350 - Fakultät für Elektrotechnik und Informationstechnik