<div class="csl-bib-body">
<div class="csl-entry">Butej, B. (2025). <i>Electrical characterization and modeling of charge accumulation and transport processes in GaN HEMTs</i> [Dissertation, Technische Universität Wien]. reposiTUm. https://doi.org/10.34726/hss.2026.141100</div>
</div>
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dc.identifier.uri
https://doi.org/10.34726/hss.2026.141100
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/227706
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dc.language
English
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dc.language.iso
en
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dc.rights.uri
http://rightsstatements.org/vocab/InC/1.0/
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dc.subject
GaN HEMT
de
dc.subject
GaN-auf-Silizium
de
dc.subject
Puffer-Ladungsfang
de
dc.subject
Lochinjektion
de
dc.subject
lateraler Lochtransport
de
dc.subject
Puffer Ladungsmodell
de
dc.subject
Back-gating
de
dc.subject
OFF-State Stress
de
dc.subject
dynamischer Einschaltwiderstand
de
dc.subject
Schwellwertspannungsverschiebung
de
dc.subject
GaN HEMT
en
dc.subject
GaN-on-Si
en
dc.subject
buffer trapping
en
dc.subject
buffer charging
en
dc.subject
hole injection
en
dc.subject
lateral hole transport
en
dc.subject
buffer charging model
en
dc.subject
back-gating
en
dc.subject
OFF-state stress
en
dc.subject
dynamic ON-resistance
en
dc.subject
threshold voltage shift
en
dc.title
Electrical characterization and modeling of charge accumulation and transport processes in GaN HEMTs
