<div class="csl-bib-body">
<div class="csl-entry">Zimmermann, H., Bugl, D., Goll, B., Hofbauer, M., Schneider-Hornstein, K., & Mahmoudi, H. (2026). Monolithic Quantum Random Number Generator Containing Si-LED, SPAD and Analog Processing. In <i>2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)</i>. 2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), Bratislava, Slovakia. IEEE. https://doi.org/10.1109/DDECS69233.2026.11521003</div>
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/228430
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dc.description.abstract
This work describes a monolithically integrated photonic quantum random number generator (QRNG) in 0.35µm CMOS. This QRNG consists of a light-emitting diode inside a deep N-well, a ring single-photon avalanche diode (SPAD), a fast cascoded active quenching and resetting circuit, and an analog evaluation circuit determining whether the random bit is a ”0” or ”1”. The random bits are created by comparison of two consecutive time intervals between photon detections using charging and discharging a capacitor with a constant current as well as a comparator. The time intervals can be in the range from 10 ns to 10 µs. With ±3.3 V supply voltage, the power consumption of the complete circuits is between 1.1 mW and 4.55 mW depending on the LED emission and detection rate of the SPAD. After XOR-hashing, the NIST tests were passed.
en
dc.language.iso
en
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dc.subject
Light emitting diodes
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dc.subject
Single-photon avalanche diodes
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dc.subject
Printing
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dc.subject
Silicon
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dc.subject
Timing
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dc.subject
Testing
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dc.subject
Current
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dc.subject
Voltage
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dc.subject
Circuits
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dc.subject
Breakdown voltage
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dc.title
Monolithic Quantum Random Number Generator Containing Si-LED, SPAD and Analog Processing
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dc.type
Inproceedings
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dc.type
Konferenzbeitrag
de
dc.relation.isbn
979-8-3315-8229-6
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dc.relation.doi
10.1109/DDECS69233.2026
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dc.relation.issn
2334-3133
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dc.rights.holder
Copyright 2026 IEEE
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dc.type.category
Full-Paper Contribution
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dc.relation.eissn
2473-2117
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tuw.booktitle
2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)