DC Field
Value
Language
dc.contributor.author
Fuchsberger, Andreas
-
dc.contributor.author
Eysin, Kilian
-
dc.contributor.author
Wind, Lukas
-
dc.contributor.author
Nazzari, Daniele
-
dc.contributor.author
Navarrete Enrique Prado
-
dc.contributor.author
Aberl, Johannes
-
dc.contributor.author
Brehm, M.
-
dc.contributor.author
Weber, Walter Michael
-
dc.contributor.author
Sistani, Masiar
-
dc.date.accessioned
2026-06-02T12:40:07Z
-
dc.date.available
2026-06-02T12:40:07Z
-
dc.date.issued
2026-05-22
-
dc.identifier.citation
<div class="csl-bib-body"> <div class="csl-entry">Fuchsberger, A., Eysin, K., Wind, L., Nazzari, D., Navarrete Enrique Prado, Aberl, J., Brehm, M., Weber, W. M., &#38; Sistani, M. (2026, May 22). <i>Enhancing Negative Differential Transconductance by Ultra-Thin Ge on SOI</i> [Conference Presentation]. 12th joint EUROSOI Workshop and international conference on ultimate integration on silicon (EUROSOI-ULIS 2026), Granada, Spain. http://hdl.handle.net/20.500.12708/228465</div> </div>
-
dc.identifier.uri
http://hdl.handle.net/20.500.12708/228465
-
dc.language.iso
en
-
dc.subject
germanium
en
dc.subject
CMOS
en
dc.subject
Schottky Barrier
en
dc.subject
SBFETs
en
dc.title
Enhancing Negative Differential Transconductance by Ultra-Thin Ge on SOI
en
dc.type
Presentation
en
dc.type
Vortrag
de
dc.contributor.affiliation
TU Wien, Austria
-
dc.contributor.affiliation
Johannes Kepler University of Linz, Austria
-
dc.contributor.affiliation
Johannes Kepler University of Linz, Austria
-
dc.contributor.affiliation
Johannes Kepler University of Linz, Austria
-
dc.type.category
Conference Presentation
-
tuw.researchTopic.id
M2
-
tuw.researchTopic.id
M1
-
tuw.researchTopic.name
Materials Characterization
-
tuw.researchTopic.name
Surfaces and Interfaces
-
tuw.researchTopic.value
50
-
tuw.researchTopic.value
50
-
tuw.publication.orgunit
E362-02 - Forschungsbereich Nanoelektronische Bauelemente
-
tuw.publication.orgunit
E056-29 - Fachbereich BioDevX
-
tuw.publication.orgunit
E057-12 - Fachbereich Zentrum für Mikro und Nanostrukturen
-
tuw.publication.orgunit
E056-04 - Fachbereich TU-DX: Towards Applications of 2D Materials
-
tuw.author.orcid
0000-0003-4267-3142
-
tuw.author.orcid
0000-0001-9504-5671
-
tuw.author.orcid
0000-0001-5730-234X
-
tuw.event.name
12th joint EUROSOI Workshop and international conference on ultimate integration on silicon (EUROSOI-ULIS 2026)
en
tuw.event.startdate
20-05-2026
-
tuw.event.enddate
22-05-2026
-
tuw.event.online
On Site
-
tuw.event.type
Event for scientific audience
-
tuw.event.place
Granada
-
tuw.event.country
ES
-
tuw.event.presenter
Weber, Walter Michael
-
wb.sciencebranch
Elektrotechnik, Elektronik, Informationstechnik
-
wb.sciencebranch.oefos
2020
-
wb.sciencebranch.value
100
-
item.languageiso639-1
en
-
item.openairecristype
http://purl.org/coar/resource_type/c_18cp
-
item.fulltext
no Fulltext
-
item.grantfulltext
none
-
item.openairetype
conference paper not in proceedings
-
item.cerifentitytype
Publications
-
crisitem.author.dept
E362-02 - Forschungsbereich Nanoelektronische Bauelemente
-
crisitem.author.dept
TU Wien, Austria
-
crisitem.author.dept
E362-02 - Forschungsbereich Nanoelektronische Bauelemente
-
crisitem.author.dept
E362-02 - Forschungsbereich Nanoelektronische Bauelemente
-
crisitem.author.dept
Johannes Kepler University of Linz, Austria
-
crisitem.author.dept
Johannes Kepler University of Linz, Austria
-
crisitem.author.dept
Johannes Kepler University of Linz, Austria
-
crisitem.author.dept
E362-02 - Forschungsbereich Nanoelektronische Bauelemente
-
crisitem.author.dept
E362-02 - Forschungsbereich Nanoelektronische Bauelemente
-
crisitem.author.orcid
0000-0003-4267-3142
-
crisitem.author.orcid
0000-0001-9504-5671
-
crisitem.author.orcid
0000-0001-5730-234X
-
crisitem.author.parentorg
E362 - Institut für Festkörperelektronik
-
crisitem.author.parentorg
E362 - Institut für Festkörperelektronik
-
crisitem.author.parentorg
E362 - Institut für Festkörperelektronik
-
crisitem.author.parentorg
E362 - Institut für Festkörperelektronik
-
crisitem.author.parentorg
E362 - Institut für Festkörperelektronik
-
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