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<div class="csl-entry">García Arango, N., Kahlenberg, R., Schuster, R., Miesenberger, B., Maawad, E., Wojcik, T., & Povoden-Karadeniz, E. (2025). In-situ HEXRD analysis of Al alloy EN AW-6082 during homogenization. <i>JOURNAL OF MATERIALS RESEARCH AND TECHNOLOGY-JMR&T</i>, <i>38</i>, 5026–5035. https://doi.org/10.1016/j.jmrt.2025.08.298</div>
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dc.identifier.issn
2238-7854
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/230762
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dc.description.abstract
The present work focuses on the microstructure evolution of an aluminium 6082 alloy during the homogenization treatment. In-situ high-energy X-ray diffraction (HEXRD) measurements enable the time-resolved study of the evolution of primary phases like β-Mg₂Si and silicon and the nucleation of new precipitates, such as α-Al₁₅(Fe,Mn)₃Si₂ dispersoids and metastable B′-Al₄Mg₈Si₇. A Python program is developed to evaluate the individual diffraction patterns and to measure the evolution of the selected peak intensities as a function of time, resolving the precipitation and dissolution reactions. Complementary transmission electron microscope (TEM) images at selected temperatures complete the picture of the microstructure evolution during homogenization.
en
dc.language.iso
en
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dc.publisher
Elsevier
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dc.relation.ispartof
JOURNAL OF MATERIALS RESEARCH AND TECHNOLOGY-JMR&T
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dc.subject
Dispersoids in 6xxx series aluminum alloys
en
dc.subject
Homogenization
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dc.subject
heterogeneous nucleation
en
dc.title
In-situ HEXRD analysis of Al alloy EN AW-6082 during homogenization
