<div class="csl-bib-body">
<div class="csl-entry">Pruckner, B., Sverdlov, V., & Selberherr, S. (2026). Critical Switching Current in Perpendicular SOT-MRAM Devices. <i>Semiconductors and Heterogeneous Integration</i>, <i>1</i>(2), 1–19. https://doi.org/10.3390/shi1020009</div>
</div>
-
dc.identifier.uri
http://hdl.handle.net/20.500.12708/231376
-
dc.description.abstract
We investigate the magnetization reversal of a ferromagnetic layer by an applied in-plane charge current in SOT-MRAM devices utilizing the spin Hall effect (SHE) as well as the SHE and an applied in-plane external magnetic field. We also consider the case of a strong field-like torque generated by other SOT mechanisms, such as Rashba-type interface effects. By deriving the steady-state solutions of the driven system and evaluating their stability, we identify two distinct mechanisms that govern deterministic switching. In the first-oscillation-driven mechanism, the magnetization is pushed past an unstable steady-state by the initial deviation following the current onset, after which it relaxes towards an alternative steady-state branch in the opposite hemisphere. As lower damping produces a larger initial oscillation amplitude at a given current, the critical current depends on the Gilbert damping constant 𝛼. We show that the usual damping-independent critical current expression is recovered in the overdamped regime with 𝛼≥1. In the instability-driven mechanism, activated by field-like torque, even a small initial oscillation grows until the equator is crossed and the magnetization ends in the opposite hemisphere. The critical switching current is the minimum of both mechanisms. Thus, the steady-state landscape reveals distinct current regimes, identifying optimal operating regimes for perpendicular reversal.
en
dc.language.iso
en
-
dc.publisher
MDPI AG
-
dc.relation.ispartof
Semiconductors and Heterogeneous Integration
-
dc.subject
macrospin
en
dc.subject
SOT MRAM
en
dc.subject
deterministic perpendicular switching
en
dc.subject
Landau–Lifshitz–Gilbert equation
en
dc.title
Critical Switching Current in Perpendicular SOT-MRAM Devices
en
dc.type
Article
en
dc.type
Artikel
de
dc.description.startpage
1
-
dc.description.endpage
19
-
dc.type.category
Original Research Article
-
tuw.container.volume
1
-
tuw.container.issue
2
-
tuw.journal.peerreviewed
true
-
tuw.peerreviewed
true
-
tuw.researchTopic.id
Q4
-
tuw.researchTopic.id
C6
-
tuw.researchTopic.name
Nanoelectronics
-
tuw.researchTopic.name
Modeling and Simulation
-
tuw.researchTopic.value
50
-
tuw.researchTopic.value
50
-
dcterms.isPartOf.title
Semiconductors and Heterogeneous Integration
-
tuw.publication.orgunit
E360-01 - Forschungsbereich Mikroelektronik
-
tuw.publisher.doi
10.3390/shi1020009
-
dc.date.onlinefirst
2026-09-15
-
dc.identifier.articleid
9
-
dc.identifier.eissn
3042-9013
-
dc.description.numberOfPages
19
-
tuw.author.orcid
0000-0002-1765-0101
-
tuw.author.orcid
0000-0002-5583-6177
-
wb.sciencebranch
Elektrotechnik, Elektronik, Informationstechnik
-
wb.sciencebranch.oefos
2020
-
wb.sciencebranch.value
100
-
item.languageiso639-1
en
-
item.cerifentitytype
Publications
-
item.openairecristype
http://purl.org/coar/resource_type/c_2df8fbb1
-
item.grantfulltext
none
-
item.fulltext
no Fulltext
-
item.openairetype
research article
-
crisitem.author.dept
E360-01 - Forschungsbereich Mikroelektronik
-
crisitem.author.dept
E360-01 - Forschungsbereich Mikroelektronik
-
crisitem.author.dept
E360 - Institut für Mikroelektronik
-
crisitem.author.orcid
0000-0002-1765-0101
-
crisitem.author.orcid
0000-0002-5583-6177
-
crisitem.author.parentorg
E360 - Institut für Mikroelektronik
-
crisitem.author.parentorg
E360 - Institut für Mikroelektronik
-
crisitem.author.parentorg
E350 - Fakultät für Elektrotechnik und Informationstechnik