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TU Wien Academic Press
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Year of Publication
DC Field
Value
Language
dc.contributor.author
Guicherd, Joachim
-
dc.contributor.author
Siebenhofer, Matthäus
-
dc.contributor.author
Venclik, Bastian
-
dc.contributor.author
Hutter, Herbert
-
dc.contributor.author
Fleig, Jürgen
-
dc.contributor.author
Kubicek, Markus
-
dc.date.accessioned
2026-10-19T08:31:29Z
-
dc.date.available
2026-10-19T08:31:29Z
-
dc.date.issued
2026-07-06
-
dc.identifier.citation
<div class="csl-bib-body"> <div class="csl-entry">Guicherd, J., Siebenhofer, M., Venclik, B., Hutter, H., Fleig, J., & Kubicek, M. (2026, July 6). <i>Oxygen-Ion Conductivity and Defect Mobility in Perovskite MIEC Thin Films</i> [Poster Presentation]. 25th International Conference on Solid State Ionics (SSI 2026), Singapore, Singapore. http://hdl.handle.net/20.500.12708/231616</div> </div>
-
dc.identifier.uri
http://hdl.handle.net/20.500.12708/231616
-
dc.language.iso
en
-
dc.subject
perovskite
en
dc.subject
Thin Films
en
dc.title
Oxygen-Ion Conductivity and Defect Mobility in Perovskite MIEC Thin Films
en
dc.type
Presentation
en
dc.type
Vortrag
de
dc.type.category
Poster Presentation
-
tuw.researchTopic.id
M2
-
tuw.researchTopic.id
M1
-
tuw.researchTopic.name
Materials Characterization
-
tuw.researchTopic.name
Surfaces and Interfaces
-
tuw.researchTopic.value
50
-
tuw.researchTopic.value
50
-
tuw.publication.orgunit
E164-04-3 - Forschungsgruppe Festkörperionik
-
tuw.publication.orgunit
E164-01-2 - Forschungsgruppe Oberflächen-, Spurenanalytik und Chemometrie
-
tuw.publication.orgunit
E057-05 - Fachbereich Analytical Instrumentation Center
-
tuw.author.orcid
0009-0006-2789-2610
-
tuw.author.orcid
0000-0002-6450-0261
-
tuw.author.orcid
0000-0002-8401-6717
-
tuw.author.orcid
0000-0001-6623-9805
-
tuw.event.name
25th International Conference on Solid State Ionics (SSI 2026)
en
tuw.event.startdate
05-07-2026
-
tuw.event.enddate
10-07-2026
-
tuw.event.online
On Site
-
tuw.event.type
Event for scientific audience
-
tuw.event.place
Singapore
-
tuw.event.country
SG
-
tuw.event.presenter
Guicherd, Joachim
-
tuw.event.track
Multi Track
-
wb.sciencebranch
Chemie
-
wb.sciencebranch.oefos
1040
-
wb.sciencebranch.value
100
-
item.openairetype
conference poster not in proceedings
-
item.cerifentitytype
Publications
-
item.fulltext
no Fulltext
-
item.grantfulltext
none
-
item.languageiso639-1
en
-
item.openairecristype
http://purl.org/coar/resource_type/c_18co
-
crisitem.author.dept
E164-04-3 - Forschungsgruppe Festkörperionik
-
crisitem.author.dept
E164-04-3 - Forschungsgruppe Festkörperionik
-
crisitem.author.dept
E164-04-3 - Forschungsgruppe Festkörperionik
-
crisitem.author.dept
E164-01-2 - Forschungsgruppe Oberflächen-, Spurenanalytik und Chemometrie
-
crisitem.author.dept
E164 - Institut für Chemische Technologien und Analytik
-
crisitem.author.dept
E164-04-3 - Forschungsgruppe Festkörperionik
-
crisitem.author.orcid
0009-0006-2789-2610
-
crisitem.author.orcid
0000-0002-6450-0261
-
crisitem.author.orcid
0000-0002-8401-6717
-
crisitem.author.orcid
0000-0001-6623-9805
-
crisitem.author.parentorg
E164-04 - Forschungsbereich Technische Elektrochemie
-
crisitem.author.parentorg
E164-04 - Forschungsbereich Technische Elektrochemie
-
crisitem.author.parentorg
E164-04 - Forschungsbereich Technische Elektrochemie
-
crisitem.author.parentorg
E164-01 - Forschungsbereich Imaging und Instrumentelle Analytische Chemie
-
crisitem.author.parentorg
E150 - Fakultät für Technische Chemie
-
crisitem.author.parentorg
E164-04 - Forschungsbereich Technische Elektrochemie
-
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