<div class="csl-bib-body">
<div class="csl-entry">Függer, M., Maier, J., Najvirt, R., Nowak, T., & Schmid, U. (2018). A Faithful Binary Circuit Model with Adversarial Noise. In <i>2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)</i>. 2018 Design, Automation & Test in Europe Conference & Exhibition, Dresden, Germany. IEEE. https://doi.org/10.23919/DATE.2018.8342219</div>
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The final publication is available via <a href="https://doi.org/10.23919/DATE.2018.8342219" target="_blank">https://doi.org/10.23919/DATE.2018.8342219</a>.
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dc.description.abstract
Accurate delay models are important for static and dynamic timing analysis of digital circuits, and mandatory for formal verification. However, Függer et al. [IEEE TC 2016] proved that pure and inertial delays, which are employed for dynamic timing analysis in state-of-the-art tools like ModelSim, NC-Sim and VCS, do not yield faithful digital circuit models. Involution delays, which are based on delay functions that are mathematical involutions depending on the previous-output-to-input time offset, were introduced by Függer et al. [DATE’15] as a faithful alternative (that can easily be used with existing tools). Although involution delays were shown to predict real signal traces reasonably accurately, any model with a deterministic delay function is naturally limited in its modeling power.
In this paper, we thus extend the involution model, by adding non-deterministic delay variations (random or even adversarial), and prove analytically that faithfulness is not impaired by this generalization. Albeit the amount of non-determinism must be considerably restricted to ensure this property, the result is surprising: the involution model differs from non-faithful models mainly in handling fast glitch trains, where small delay shifts have large effects. This originally suggested that adding even small variations should break the faithfulness of the model, which turned out not to be the case. Moreover, the results of our simulations also confirm that this generalized involution model has larger modeling power and, hence, applicability.
en
dc.description.sponsorship
Fonds zur Förderung der Wissenschaftlichen Forschung
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dc.description.sponsorship
Fonds zur Förderung der Wissenschaftlichen Forschung
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dc.language
English
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dc.language.iso
en
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dc.publisher
IEEE
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dc.rights.uri
http://rightsstatements.org/vocab/InC/1.0/
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dc.subject
digital dynamic delay model
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dc.subject
uncertainty
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dc.subject
SPICE simulation
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dc.title
A Faithful Binary Circuit Model with Adversarial Noise
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dc.type
Inproceedings
en
dc.type
Konferenzbeitrag
de
dc.rights.license
In Copyright
en
dc.rights.license
Urheberrechtsschutz
de
dc.contributor.affiliation
Université Paris-Saclay, France
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dc.relation.isbn
9783981926309
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dc.relation.doi
10.23919/DATE42667.2018
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dc.relation.grantno
P26436-N30
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dc.relation.grantno
P21694
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dc.rights.holder
2018 IEEE.
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dc.type.category
Full-Paper Contribution
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dc.publisher.place
Dresden, Germany
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tuw.booktitle
2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)
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tuw.version
am
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tuw.publication.orgunit
E191 - Institut für Computer Engineering
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tuw.publisher.doi
10.23919/DATE.2018.8342219
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dc.identifier.libraryid
AC15666407
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dc.description.numberOfPages
6
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dc.identifier.urn
urn:nbn:at:at-ubtuw:3-10170
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tuw.author.orcid
0000-0002-0965-5746
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dc.rights.identifier
In Copyright
en
dc.rights.identifier
Urheberrechtsschutz
de
tuw.event.name
2018 Design, Automation & Test in Europe Conference & Exhibition
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tuw.event.startdate
19-03-2018
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tuw.event.enddate
23-03-2018
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tuw.event.online
On Site
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tuw.event.type
Event for scientific audience
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tuw.event.place
Dresden
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tuw.event.country
DE
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tuw.event.presenter
Függer, Matthias
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item.fulltext
with Fulltext
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item.grantfulltext
open
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item.openairecristype
http://purl.org/coar/resource_type/c_5794
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item.cerifentitytype
Publications
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item.languageiso639-1
en
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item.openairetype
conference paper
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item.openaccessfulltext
Open Access
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item.mimetype
application/pdf
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crisitem.author.dept
E182 - Institut für Technische Informatik
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crisitem.author.dept
E191-02 - Forschungsbereich Embedded Computing Systems
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crisitem.author.dept
E191-02 - Forschungsbereich Embedded Computing Systems
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crisitem.author.dept
Université Paris-Saclay
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crisitem.author.dept
E191-02 - Forschungsbereich Embedded Computing Systems