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DC Field
Value
Language
dc.contributor.author
Pobegen, G.
-
dc.contributor.author
Aichinger, T.
-
dc.contributor.author
Grasser, Tibor
-
dc.contributor.author
Nelhiebel, M.
-
dc.date.accessioned
2022-08-09T16:54:15Z
-
dc.date.available
2022-08-09T16:54:15Z
-
dc.date.issued
2011
-
dc.identifier.citation
<div class="csl-bib-body">
<div class="csl-entry">Pobegen, G., Aichinger, T., Grasser, T., & Nelhiebel, M. (2011). Impact of Gate Poly Doping and Oxide Thickness on the N- and PBTI in MOSFETs. In <i>Proceedings of the 22nd European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis</i> (pp. 1530–1534). http://hdl.handle.net/20.500.12708/72337</div>
</div>
-
dc.identifier.uri
http://hdl.handle.net/20.500.12708/72337
-
dc.title
Impact of Gate Poly Doping and Oxide Thickness on the N- and PBTI in MOSFETs
-
dc.type
Konferenzbeitrag
de
dc.type
Inproceedings
en
dc.relation.publication
Proceedings of the 22nd European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis
-
dc.description.startpage
1530
-
dc.description.endpage
1534
-
dc.type.category
Full-Paper Contribution
-
tuw.booktitle
Proceedings of the 22nd European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis
-
tuw.peerreviewed
false
-
tuw.publication.orgunit
E360 - Institut für Mikroelektronik
-
dc.description.numberOfPages
5
-
tuw.event.name
22nd European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis
-
tuw.event.startdate
03-10-2011
-
tuw.event.enddate
07-10-2011
-
tuw.event.online
On Site
-
tuw.event.type
Event for scientific audience
-
tuw.event.place
Bordeaux, France
-
tuw.event.country
EU
-
tuw.event.presenter
Pobegen, G.
-
wb.sciencebranch
Elektrotechnik, Elektronik
-
wb.sciencebranch.oefos
25
-
wb.facultyfocus
Mikro- und Nanoelektronik
de
wb.facultyfocus
Micro- and Nanoelectronics
en
wb.facultyfocus.faculty
E350
-
wb.presentation.type
science to science/art to art
-
item.grantfulltext
restricted
-
item.fulltext
no Fulltext
-
item.openairetype
conference paper
-
item.openairecristype
http://purl.org/coar/resource_type/c_5794
-
item.cerifentitytype
Publications
-
crisitem.author.dept
E363-50 - Services des Instituts
-
crisitem.author.dept
E360 - Institut für Mikroelektronik
-
crisitem.author.parentorg
E363 - Institut für Biomedizinische Elektronik
-
crisitem.author.parentorg
E350 - Fakultät für Elektrotechnik und Informationstechnik
