<div class="csl-bib-body">
<div class="csl-entry">Scharinger, A., Manstetten, P., Hössinger, A., & Weinbub, J. (2020). Generative Model Based Adaptive Importance Sampling for Flux Calculations in Process TCAD. In <i>2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)</i>. 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Tokyo, Japan. IEEE. https://doi.org/10.23919/sispad49475.2020.9241615</div>
</div>
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/77160
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dc.language.iso
en
-
dc.relation.ispartofseries
International Conference on Simulation of Semiconductor Processes and Devices
-
dc.title
Generative Model Based Adaptive Importance Sampling for Flux Calculations in Process TCAD
en
dc.type
Konferenzbeitrag
de
dc.type
Inproceedings
en
dc.relation.publication
2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
-
dc.contributor.affiliation
Silvaco (United Kingdom), United Kingdom of Great Britain and Northern Ireland (the)
-
dc.relation.isbn
978-4-86348-763-5
-
dc.relation.doi
10.23919/SISPAD49475.2020.9241672
-
dc.relation.issn
1946-1569
-
dc.type.category
Full-Paper Contribution
-
dc.relation.eissn
1946-1577
-
tuw.booktitle
2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
-
tuw.relation.publisher
IEEE
-
tuw.publication.orgunit
E360 - Institut für Mikroelektronik
-
tuw.publisher.doi
10.23919/sispad49475.2020.9241615
-
dc.description.numberOfPages
4
-
tuw.event.name
2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
-
tuw.event.startdate
23-09-2020
-
tuw.event.enddate
06-10-2020
-
tuw.event.online
On Site
-
tuw.event.type
Event for scientific audience
-
tuw.event.place
Tokyo
-
tuw.event.country
JP
-
tuw.event.presenter
Scharinger, Alexander
-
wb.sciencebranch
Elektrotechnik, Elektronik, Informationstechnik
-
wb.sciencebranch.oefos
2020
-
wb.facultyfocus
Mikro- und Nanoelektronik
de
wb.facultyfocus
Micro- and Nanoelectronics
en
wb.facultyfocus.faculty
E350
-
wb.presentation.type
science to science/art to art
-
item.languageiso639-1
en
-
item.openairetype
conference paper
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item.grantfulltext
restricted
-
item.fulltext
no Fulltext
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item.cerifentitytype
Publications
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item.openairecristype
http://purl.org/coar/resource_type/c_5794
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crisitem.author.dept
E360-01 - Forschungsbereich Mikroelektronik
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crisitem.author.dept
E360 - Institut für Mikroelektronik
-
crisitem.author.dept
E360-01 - Forschungsbereich Mikroelektronik
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crisitem.author.orcid
0000-0001-5969-1932
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crisitem.author.parentorg
E360 - Institut für Mikroelektronik
-
crisitem.author.parentorg
E350 - Fakultät für Elektrotechnik und Informationstechnik
